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Systematic Study of Transparent Conductors in the (Zinc, Gallium)-Indium-Tin Oxide Systems

Published online by Cambridge University Press:  10 February 2011

George B. Palmer
Affiliation:
Department of Chemistry and Materials Research Center, Northwestern University, 2145 Sheridan Road, Evanston, IL 60208-3113, USA, g-palmer@nwu.edu
Kenneth R. Poeppelmeier
Affiliation:
Department of Chemistry and Materials Research Center, Northwestern University, 2145 Sheridan Road, Evanston, IL 60208-3113, USA, krp@nwu.edu Contact author
Doreen D. Edwards
Affiliation:
Department of Materials Science and Engineering and Materials Research Center, Northwestern University, 2225 North Campus Drive, Evanston, IL 60208, USA Permanent Address: School of Ceramics and Materials Sciences, Alfred University, Alfred, NY, USA, fdedwards@bigvax.alfred.edu
Thomas O. Mason
Affiliation:
Department of Materials Science and Engineering and Materials Research Center, Northwestern University, 2225 North Campus Drive, Evanston, IL 60208, USA, t-mason@nwu.edu
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Abstract

Bulk samples of transparent conducting oxides (TCOs) in the Zn-In-Sn and Ga-In-Sn oxide systems were prepared by solid state processing. Phase relations and physical properties were determined and the results compared to similar measurements on thin film materials.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

1. , Fan and , Goodenough, J. Appl. Phys. 1977, 48, 3524.Google Scholar
2. Lyman, N. R.; Proceedings of the Symposium on Electrochromic Materials, Electrochemical Society Proceedings 1990, 90–92, 201231.Google Scholar
3. Wang, R.; Sleight, A.; Platzer, R.; Gardner, J. A. J. Mater. Res. 1996, 11, 1659.Google Scholar
4. Minami, T.; Kakumu, T.; Takata, S. J Vac. Si. Technol. A 1996, 14, 1704.Google Scholar
5. Phillips, J. M.; Cava, R. J.; Thomas, G. A.; Carter, S. A.; Kwo, J.; Siegrist, T.; Krajewski, J.; Marshall, J.; Peck, W.; Rapkine, D. AppL. Phys. Lett. 1995, 67, 2246.Google Scholar
6. Enoki, H.; Nakayama, T.; Echiyoga, J. Phys. Stat. Sol. 1992, 129, 181.Google Scholar
7. Minami, T.; Takata, S. Sonohara, H. J. Vac. Sci. Technol. 1995, 13, 1095.Google Scholar
8. Minami, T.; Takata, S.; Kakumu, T. J Vac. Sci. Technol. A 1996, 14, 1689.Google Scholar
9. Phillips, J. M.; Kwo, J.; Thomas, G. A.; Carter, S. A.; Cava, R. J.; Hou, S. Y.; Krajewski, J. J.; Marshall, J. H.; Peck, W. F.; Rapkine, D. H.; Van Dover, R. B. Appl. Phys. Lett. 1994, 65, 115.Google Scholar
10. Smits, F. M. BellSyst. Techn. J. 1958, 37, 711.Google Scholar
11. Hecht, H. In Modern Aspects of Reflectance Spectroscopy; Wendlant, W., Ed.; Plenum Press: New York, 1968;Google Scholar
12. Cannard, P. J.; Tilley, R. J. D.. Solid State chem. 1988, 73, 418.Google Scholar
13. Moriga, T.; Edwards, D.; Mason, T.; Palmer, G.; Poeppelmeier, K.; Schindler, J.; Kannewurf, C.; Nakabayashi, I. J. Amer. Ceram. Soc. 1998, 81, 1310.Google Scholar
14. Palmer, G. B.; Poeppelmeier, K. R.; Mason, T. J. Chem. Mater. 1997, 9, 3121.Google Scholar
15. Palmer, G. B.; Poeppelmeier, K. R.; Mason, T. O. J. Solid State Chem. 1997, 134, 192.Google Scholar
16. Edwards, D. D.; Folkins, P. E.; Mason, T. O. J. Amer. Ceram Soc. 1997, 80, 253.Google Scholar
17. Edwards, D. D.; Mason, T. O.; Goutenoire, F.; Poepplemeier, K. R. Appl. Phys. Lett. 1997, 70, 1706.Google Scholar
18. Edwards, D. D.; Mason, T. O. J. Amer. Ceram. Soc. In press. (Ternary diagram).Google Scholar