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Study on Effects of Heavy Ion Irradiation on CeO2 by Using Synchrotron Radiation X-Ray Absorption Spectroscopy -as a Simulation Study for Radiation Damage in High-Burnup Light Water Reactor Fuels-

Published online by Cambridge University Press:  01 February 2011

Hirotaka Ohno
Affiliation:
bm0802@mtr.osakafu-u.ac.jp, Osaka Prefecture University, Sakai, 599-8531, Japan
Daiju Matsumura
Affiliation:
daiju@spring8.or.jp, Japan Atomic Energy Agency, Sayo, 679-5148, Japan
Yasuo Nishihata
Affiliation:
yasuon@spring8.or.jp, Japan Atomic Energy Agency, Sayo, 679-5148, Japan
Jun'ichiro Mizuki
Affiliation:
mizuki@spring8.or.jp, Japan Atomic Energy Agency, Sayo, 679-5148, Japan
Norito Ishikawa
Affiliation:
ishikawa.norito@jaea.go.jp, Japan Atomic Energy Agency, Tokai-mura, 319-1195, Japan
Takeshi Sonoda
Affiliation:
t-sonoda@criepi.denken.or.jp, Central Research Institute of Electric Power Industry, Komae, 201-8511, Japan
Motoyasu Kinoshita
Affiliation:
moto@butsuri.net, Central Research Institute of Electric Power Industry, Komae, 201-8511, Japan
Akihiro Iwase
Affiliation:
iwase@mtr.osakafu-u.ac.jp, Osaka Prefecture University, Sakai, 599-8531, Japan
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Abstract

CeO2 thin films were irradiated with 200MeV Xe ions. Effects of the irradiation were studied by using Extended X-ray Absorption Fine Structure (EXAFS) measurement at SPring8 synchrotron radiation facility. EXAFS spectra for the irradiated thin films near the Ce K-edge show that the coordination number for oxygen atoms around Ce atom decreases and that the Ce-O Debye-Waller factor increases by the irradiation. The atomic distance between oxygen atom and Ce atom does not vary within the accuracy of EXAFS measurement. The effect of high density electronic excitation on the structure of CeO2 is discussed.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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References

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