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Studies of thin film ferroelectrics with charge-compensated substitutions in BST

Published online by Cambridge University Press:  01 February 2011

Daniel Potrepka
Affiliation:
Sensors & Electron Devices Directorate, U.S. Army Research Laboratory, Adelphi, MD 20783-1197, U.S.A.
Steven Tidrow
Affiliation:
Sensors & Electron Devices Directorate, U.S. Army Research Laboratory, Adelphi, MD 20783-1197, U.S.A.
Arthur Tauber
Affiliation:
Sensors & Electron Devices Directorate, U.S. Army Research Laboratory, Adelphi, MD 20783-1197, U.S.A.
Kevin Kirchner
Affiliation:
Sensors & Electron Devices Directorate, U.S. Army Research Laboratory, Adelphi, MD 20783-1197, U.S.A.
Bernard Rod
Affiliation:
Sensors & Electron Devices Directorate, U.S. Army Research Laboratory, Adelphi, MD 20783-1197, U.S.A.
James Horwitz
Affiliation:
Naval Research Lab, Washington, DC 20375, U.S.A.
Wontae Chang
Affiliation:
Naval Research Lab, Washington, DC 20375, U.S.A.
Nissim Navi
Affiliation:
School of Engineering and Applied Science, George Washington University, Washington, DC 20052, U.S.A. Permanent Address-Nuclear Research Center- Negev Beer Sheva 9001, Israel
Daniel Bubb
Affiliation:
Naval Research Lab, Washington, DC 20375, U.S.A. Permanent Address-Department of Physics, Seton Hall University, South Orange, NJ 07079, U.S.A.
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Abstract

Thin films were prepared from bulk targets by pulsed-laser deposition techniques. The targets were composed of Ba0.6Sr0.4TiO3 with charge-compensated substitutions for Ti4+. Results of the dielectric characterization measurements will be discussed and compared to the results of similar measurements in bulk materials with the same composition.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

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References

1. Potrepka, D. M., Tidrow, S. C., and Tauber, A., to be published in Integrated Ferroelectrics 42, 97 (2002).CrossRefGoogle Scholar
2. Wu, H.-D., et al., IEEE Trans. Appl. Supercond. 4, 156 (1994).Google Scholar
3. Potrepka, D. M., Tidrow, S. C., Tauber, A., Kirchner, K. W., Ervin, M. H., Deb, K. K., Rod, B. J., and Crowne, F. J. in Materials Issues for Tunable RF and Microwave Devices III, Proceedings of 2002 MRS Spring Meeting, paper number H5.5, San Francisco, CA (2002).Google Scholar
4. Wu, H.-D. and Barnes, F. S., Integrated Ferroelectrics 22, 291 (1998).CrossRefGoogle Scholar

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