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Structural and Electro-Optic Properties of Laser-Ablated Ferroelectric Bi4Ti3O12 Thin Films

Published online by Cambridge University Press:  01 January 1992

William Jo
Affiliation:
Department of Physics, Seoul National University, 151–742, Seoul, Korea
Hag-Ju Cho
Affiliation:
Department of Physics, Seoul National University, 151–742, Seoul, Korea
Tae Won Noh
Affiliation:
Department of Physics, Seoul National University, 151–742, Seoul, Korea
Yun Seok Cho
Affiliation:
Department of Physics, Seoul National University, 151–742, Seoul, Korea
Suk-Il Kwun
Affiliation:
Department of Physics, Seoul National University, 151–742, Seoul, Korea
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Abstract

Ferroelectric Bi4Ti3O12 thin films have been deposited using second harmonics of a Q-switched Nd:YAG laser. Various single crystal substrates, including SrTiO3(100), SrTiO3(110). MgO(100), and MgO(110), were used. Structural and electro-optic properties of the films were investigated using XRD, x-ray pole figure, and linear birefringence measurements. It is found that substrate kinds and their surface orientations are important growth parameters which determine crystal axis orientation and electro-optic properties of the Bi4Ti3O12 thin films.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

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Structural and Electro-Optic Properties of Laser-Ablated Ferroelectric Bi4Ti3O12 Thin Films
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