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Stability of Indium Tin Oxide/Polymer Interfaces

Published online by Cambridge University Press:  11 February 2011

X. Crispin
Affiliation:
Department of Physics, IFM, Linköping University, S-58183 Linköping, Sweden.
A. Crispin
Affiliation:
Department of Physics, IFM, Linköping University, S-58183 Linköping, Sweden.
S. Marciniak
Affiliation:
Department of Physics, IFM, Linköping University, S-58183 Linköping, Sweden.
W. Osikowicz
Affiliation:
Department of Physics, IFM, Linköping University, S-58183 Linköping, Sweden.
S. Jönsson
Affiliation:
Department of Science and Technology, Campus Norrköping, Linköping University, S-60174 Norrköping, Sweden.
M. Fahlman
Affiliation:
Department of Science and Technology, Campus Norrköping, Linköping University, S-60174 Norrköping, Sweden.
Th. Kugler
Affiliation:
ACREO AB, Bredgatan 34, S-60221 Norrköping, Sweden.
L. J. van IJzendoorn
Affiliation:
Centre for Plasmaphysics and Radiation Technology, Department of Applied Physics, Eindhoven University of Technology, Eindhoven, The Netherlands.
W. R. Salaneck
Affiliation:
Department of Physics, IFM, Linköping University, S-58183 Linköping, Sweden.
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Abstract

Interfacial chemistry at indium tin oxide/polymer interfaces is of fundamental importance for the performance of polymer-based light emitting diodes. X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry are used to investigate the stability of the interface formed between indium tin oxide and (i) the light emitting polymer poly(p-phenylenevinylene), and (ii) the hole injecting layer poly(3,4-ethylenedioxythiophene) polystyrenesulfonate. The formed interfaces are not stable and indium-containing species diffuse from the metal oxide surface into the polymer layers.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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References

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