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SPM-based Electrical Characterization of Aged Waspaloy Microstructures

Published online by Cambridge University Press:  01 February 2011

Siva Kumar V. Kelekanjeri G.
Affiliation:
sk140@mail.gatech.edu, Georgia Institute of Technology, School of Materials Science and Engineering, 2025 Peachtree Rd.,, Apt#649,, Atlanta, GA, 30309, United States, 4046431431, 4048949140
Rosario A Gerhardt
Affiliation:
rosario.gerhardt@mse.gatec.edu, Georgia Institute of Technology, School of Materials Science and Engineering, 771 Ferst Drive,, Room 288, Love Bldg.,, Atlanta, GA, 30332-0245, United States
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Abstract

The results of SPM-based localized electrical examination of precipitation hardened Waspaloy microstructures using Electrostatic Force Microscopy (EFM) and Current-Atomic Force Microscopy (I-AFM) are reported herein. The measurements were conducted on two differently etched specimens with the same initial microstructure. Selective etching by preferentially removing the γ′ or the γ phase resulted in a non-uniform surface topography leaving the less reactive phase standing in relief relative to the depressed phase. The presence of a non-uniform surface topography affected the measured EFM response by causing an inhomogeneous surface voltage distribution. A non-linear tip-surface interaction could have further complicated the measured EFM response by making it non-localized. The EFM phase obeyed a supplementary behavior upon reversing the polarity of the DC bias. Using I-AFM, the tip current was found to be the highest at γ-γ′ interphase boundaries, which was attributed to the relaxation of the lattice atoms in the relief zone formed upon etching.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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References

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