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Spin Polarized Low Energy Electron Microscopy (Spleem) of Single and Combined Layers of Co, Cu, and Pd on W (110)

Published online by Cambridge University Press:  03 September 2012

Helmut Poppa
Affiliation:
IBM Research, Almadén Research Center, 650 Harry Rd.,San Jose, CA 95120
Heiko Pinkvos
Affiliation:
Physikalisches Institut, Universitaet Clausthal, 3392-Clausthal-Zellerfeld, Leibnizstrasse 4, Germany
Karsten Wurm
Affiliation:
Physikalisches Institut, Universitaet Clausthal, 3392-Clausthal-Zellerfeld, Leibnizstrasse 4, Germany
Ernst Bauer
Affiliation:
IBM Research, Almadén Research Center, 650 Harry Rd.,San Jose, CA 95120
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Abstract

In-situ recording of ultra-thin film growth by Low Energy Electron Microscopy (LEEM) results in accurate determinations of monolayer metal deposition rates for difficult to calibrate deposition geometries. Deposition rates and growth features were determined for Cu and Co on W (110) allowing for thickness control at the submonolayer level. Also, the transparencies of non-Magnetic overlayers of Pd (111) and Cu (111) to very low energy spin polarized electrons were compared and qualitatively explained by band structure considerations. Cu (111) is much more transparent than Pd (111) so that magnetic domain structures can be observed through at least 4 nmof Cu (111). This suggests the use of Cu (111) and other metals of suitable band structure as protective layers for surface magnetic studies.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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Spin Polarized Low Energy Electron Microscopy (Spleem) of Single and Combined Layers of Co, Cu, and Pd on W (110)
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