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Soft X-Ray Emission and Resonant Inelastic X-Ray Scattering Studies of Transition Metal Oxides.

Published online by Cambridge University Press:  11 February 2011

Kevin E. Smith
Affiliation:
Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215
Cormac McGuinness
Affiliation:
Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215
James Downes
Affiliation:
Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215
Philip Ryan
Affiliation:
Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215
Dongfeng Fu
Affiliation:
Department of Physics, Boston University, 590 Commonwealth Avenue, Boston, MA 02215
Steven L. Hulbert
Affiliation:
National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973
J.M. Honig
Affiliation:
Department of Chemistry, Purdue University, West Lafayette, IN 47907, USA
Russel Egdell
Affiliation:
Inorganic Chemistry Laboratory, Oxford University, Oxford, UK.
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Abstract

This paper discusses the application of soft x-ray emission and resonant inelastic x-ray scattering as probes of the electronic structure of transition metal oxides. The results of studies on the narrow gap insulator CdO, and the Mott-Hubbard oxide Cr-doped V2O3, are reported. The O 2p valence band partial density of states for CdO has been measured, and emission due to the hybridization of the O 2p valence band states with Cd 4d shallow core level has been observed. For Cr-doped V2O3, the temperature induced metal-insulator transition in samples with 1.5% Cr was observed using soft x-ray emission, and both charge transfer and dipole forbidden d-d excitations were observed using resonant inelastic x-ray scattering.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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