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Single Crystal CVD Diamond Detectors: Position and Temporal Response Measurements using a Synchrotron Microbeam Probe

Published online by Cambridge University Press:  01 February 2011

John Morse
Affiliation:
morse@esrf.fr, European Synchrotron Radiation Facility, Experiments Division, 6 rue Jules Horowitz, Grenoble, 38240, France, 33476882126, 33476882542
Murielle Salomé
Affiliation:
salome@esrf.fr, European Synchrotron Radiation Facility, Experiments Division, 6 rue Jules Horowitz, Grenoble, 38240, France
Eleni Berdermann
Affiliation:
e.berdermann@gsi.de, Gesellschaft für Schwerionenforschung, Detektorlabor, Planckstrasse 1, Darmstadt, 64291, Germany
Michal Pomorski
Affiliation:
m.pomorski@gsi.de, Gesellschaft für Schwerionenforschung, Detektorlabor, Planckstrasse 1, Darmstadt, 64291, Germany
James Grant
Affiliation:
j.grant@physics.gla.ac.uk, University of Glasgow, Physics and Astronomy, University Avenue, Glasgow, G128QQ, United Kingdom
Val O'Shea
Affiliation:
v.oshea@physics.gla.ac.uk, University of Glasgow, Physics and Astronomy, University Avenue, Glasgow, G128QQ, United Kingdom
Petr Ilinski
Affiliation:
petr.ilinski@desy.de, Deutsches Elektronen-Synchrotron, HASYLAB, Notkestraße 85, Hamburg, D-22607, Germany
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Abstract

Ultrapure, homoeptaxially grown CVD single crystal diamond is a material with great potential for the fabrication of ionizing radiation detectors for high energy, heavy ion physics, and realtime dosimetry for radiotherapy. Only diamond has suitable transmission properties and can offer the required radiation hardness for synchrotron X-ray beam monitoring applications. We report on experiments made using a synchrotron X-ray microbeam probe to investigate the performance of single crystal diamonds operated as position sensitive, solid state ‘ionization chambers’. We show that for a wide range of electric fields >0.3Vµm−1, suitably prepared devices give excellent spatial response uniformity and time stability. With an applied field of 2Vµm−1 complete charge collection times are ∼1nsec for a diamond plate thickness of 100µm. Position sensitivity was obtained for an X-ray beam incident on the isolation gap between adjacent electrodes of a quadrant device: here, a crossover response region that results from charge carrier diffusion extends over ∼20µm. Using GHz bandwidth signal processing electronics, the signal charge collection process was measured with spatial and temporal resolutions of 1µm and <50ps.

Type
Research Article
Copyright
Copyright © Materials Research Society 2008

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References

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