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Preparation of Plate-Like Bulk Beta Iron-Disilicide Crystals Using Metal to Semiconductor Phase Transition by Heat Treatment

Published online by Cambridge University Press:  11 February 2011

Masato Osamura
Affiliation:
System Engineering Corporation, Yamato, Kanagawa, 242–0001, Japan National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 2, Umezono1–1–1, Tsukuba, 305–8568, Japan
Hidetaka Ishihara
Affiliation:
Nippon Institute of Technology, Miyashiromachi, Minami-saitamagun, Saitama, 345–8501, Japan
Zhengxin Liu
Affiliation:
System Engineering Corporation, Yamato, Kanagawa, 242–0001, Japan National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 2, Umezono1–1–1, Tsukuba, 305–8568, Japan
Hisao Tanoue
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 2, Umezono1–1–1, Tsukuba, 305–8568, Japan
Shirou. Sakuragi
Affiliation:
Union Material Co. Ltd., Tonemachi, Hita-soumagun, Ibaraki, 300–1602, Japan
Yasushi Hoshino
Affiliation:
Nippon Institute of Technology, Miyashiromachi, Minami-saitamagun, Saitama, 345–8501, Japan
Yasuhiko Nakayama
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 2, Umezono1–1–1, Tsukuba, 305–8568, Japan Japan Science and Technology Corporation (JST), 16–1 Onogawa, Tsukuba, 305–8569, Japan
Yunosuke Makita
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), AIST Tsukuba Central 2, Umezono1–1–1, Tsukuba, 305–8568, Japan
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Abstract

Plate-like β-FeSi2 bulk crystals with size of 10×10 mm2 and thickness of 1 mm were fabricated by annealing CVT (chemical vapor transport)-grown plate-like α-Fe2Si5 at 800°C in Ar atmosphere. Before annealing, α-Fe2Si5 crystals were characterized by x-ray diffraction (XRD) and scanning electron microscopy (SEM) to be single crystals with flat surfaces. XRD measurements of β-FeSi2 crystals subjected to annealing showed that they had a po lycrystalline structure. The mean Fe/Si co mposit ion rat io of β-FeSi2 crystal measured by energy dispersive x-ray spectroscopy (EDX) was 31/69 and it was the same as that of α-Fe2Si5 bulk crystal before annealing. SEM, Raman scattering and electron probe micro-analysis (EPMA) measurements identified that there existed small Si precipitates mixed in the matrix of β-FeSi2 crystals. At annealing temperature of 800°C, the plate-like β-FeSi2 bulk was obtained even the annealing duration time was as short as 5 hours.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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References

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