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Plan-View Transmission Electron Microscopy Of Crack Tips In Bulk Materials
Published online by Cambridge University Press: 15 February 2011
Abstract
A focused ion beam (FIB) system has been applied to prepare a thin foil specimen of Si, MgO and alumina which contained cracks in the plane of foil. It was possible to observe a much larger area at and near a crack tip than has been hitherto possible. FIB was also applied to observation of microstructure near a crack tip evolved during severe rolling contact fatigue in a steel.
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- Copyright © Materials Research Society 1996
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