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Photon Scanning Tunneling Microscopy of Optical Wavegnide Structures

Published online by Cambridge University Press:  21 February 2011

Ahn Goo Choo
Affiliation:
Department of Physics, University of Cincinnati, Cincinnati, OH 45221-0011
Mona H. Chudgar
Affiliation:
Department of Physics, University of Cincinnati, Cincinnati, OH 45221-0011
Howard E Jackson
Affiliation:
Department of Physics, University of Cincinnati, Cincinnati, OH 45221-0011
Gregory N. De Brabander
Affiliation:
Department of Electrical and Computer Engineering, University of Cincinnati, Cincinnati, OH 45221-0030
Mukesh Kumar
Affiliation:
Department of Electrical and Computer Engineering, University of Cincinnati, Cincinnati, OH 45221-0030
Joseph T. Boyd
Affiliation:
Department of Electrical and Computer Engineering, University of Cincinnati, Cincinnati, OH 45221-0030
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Abstract

Photon scanning tunneling microscopy (PSTM) has been used to obtain effective refractive indices of optical channel waveguide structures. The local evanescent field intensity associated with the propagation modes of optical channel waveguides are measured at two different wavelengths. Both a tapered optical fiber tip and a semiconductor heterostructure tip are employed for detection. Local values of effective refractive index are measured for both TE and TM polarizations and compared to model calculations.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

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References

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8. See, for instance, Hunsperger, R. G., Integrated optics: Theory and Technology, 3rd Edition, (Springer-Verlag, New York, 1991), and H. Nishihara, M. Haruna, and T. Suhara, Optical Integrated Circuits, (McGraw-Hill, New York, 1989).CrossRefGoogle Scholar

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