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Phase Transformation Related Conductivity Degradation of NiO Doped YSZ: An In-situ Micro-Raman Analysis

Published online by Cambridge University Press:  10 May 2012

Haruo Kishimoto
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST) AIST Central No. 5, Higashi 1-1-1, Tsukuba, Ibaraki, 305-8565 Japan
Keiji Yashiro
Affiliation:
Tohoku University, LAMR2 bldg., 2-1-1 Katahira, Aoba-ku, Sendai, 980-8577 Japan
Taro Shimonosono
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST) AIST Central No. 5, Higashi 1-1-1, Tsukuba, Ibaraki, 305-8565 Japan
Manuel E. Brito
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST) AIST Central No. 5, Higashi 1-1-1, Tsukuba, Ibaraki, 305-8565 Japan
Katsuhiko Yamaji
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST) AIST Central No. 5, Higashi 1-1-1, Tsukuba, Ibaraki, 305-8565 Japan
Teruhisa Horita
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST) AIST Central No. 5, Higashi 1-1-1, Tsukuba, Ibaraki, 305-8565 Japan
Harumi Yokokawa
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST) AIST Central No. 5, Higashi 1-1-1, Tsukuba, Ibaraki, 305-8565 Japan
Junichiro Mizusaki
Affiliation:
Tohoku University, LAMR2 bldg., 2-1-1 Katahira, Aoba-ku, Sendai, 980-8577 Japan
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Abstract

In-situ micro Raman spectroscopy has been adopted as one of the most powerful analytical techniques with high spacial resolution under controlled atmospheres. In the present study, phase transformation of NiO doped yttria stabilized zirconia (YSZ) was monitored by in-situ micro-Raman spectroscopy. Raman spectra change caused by the phase transformation from the cubic phase to the tetragonal phase was observed for the NiO doped YSZ during annealing at a high temperature of 1173 K under reducing atmosphere.

Type
Research Article
Copyright
Copyright © Materials Research Society 2012

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References

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