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Nanoscale scanning near-field ellipsometric microscopy (SNEM) imaging of heterogeneous polymers

Published online by Cambridge University Press:  27 February 2014

Aysegul Cumurcu
Affiliation:
Materials Science and Technology of Polymers, MESA+ Institute for Nanotechnology, University of Twente, Enschede, NL-7500, The Netherlands.
Joost Duvigneau
Affiliation:
Materials Science and Technology of Polymers, MESA+ Institute for Nanotechnology, University of Twente, Enschede, NL-7500, The Netherlands.
Ian D. Lindsay
Affiliation:
Nanophysics and Soft Matter Group, H.H. Wills Physics Laboratory, University of Bristol, Tyndall Avenue, Bristol BS8 1TL, United Kingdom.
Peter Schön
Affiliation:
Materials Science and Technology of Polymers, MESA+ Institute for Nanotechnology, University of Twente, Enschede, NL-7500, The Netherlands.
G. Julius Vancso*
Affiliation:
Materials Science and Technology of Polymers, MESA+ Institute for Nanotechnology, University of Twente, Enschede, NL-7500, The Netherlands.
*
*Corresponding author: Prof. G. Julius Vancso, Tel: +31(0)53-4892967 Fax: +31 (0)53 489 3823 E-mail: g.j.vancso@utwente.nl
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Abstract

In this study a scanning near-field ellipsometric microscope (SNEM), a hybrid device of an atomic force microscope (AFM) and an ellipsometer, is used to obtain optical images of heterogeneous polymer thin films with a resolution below the diffraction limit of light. SNEM optical images of a microphase separated PS-b-P2VP block copolymer film collected with gold coated and bare silicon AFM probe tips were compared to obtain a deeper insight into the nature of the SNEM contrast mechanism. Furthermore, intensity vs. distance curves were recorded on a PS-b-PMMA block copolymer film simultaneously during the acquisition of force-displacement curves to study the far-field contribution of the optical signal to the optical image.

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Copyright
Copyright © Materials Research Society 2014 

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