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Nanoindentation probing of high-aspect ratio pillar structures on optical multilayer dielectric diffraction gratings
Published online by Cambridge University Press: 02 August 2012
We measure the mechanical response of optical multilayer dielectric (MLD) diffraction gratings, geometries which are constrained in only one transverse direction but free in the other, using nanoindentation. The results are explained using a stress-strain model, which reveals a uniaxial yield stress of 4.1- 4.6 GPa and predicts a similar dependence of yield stress on loads for both fully-elastic and fully-plastic solutions. Following R. Hill’s model of an expanding cavity under internal pressure, we show that the indentation response of the high-aspect ratio “pillar” geometry can be expressed in terms of uniaxial yield stress rather than material hardness.
- MRS Online Proceedings Library (OPL) , Volume 1474: Symposium CCC – Local Probing Techniques and In-Situ Measurements in Materials Science , 2012 , mrss12-1474-ccc08-13
- Copyright © Materials Research Society 2012