Skip to main content Accessibility help
×
Home
Hostname: page-component-568f69f84b-h2zp4 Total loading time: 0.21 Render date: 2021-09-18T18:08:01.254Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true, "newUsageEvents": true }

Microstrucrure and Properties of In-Situ R. F. Sputtered YBa2Cu3O7−x Thin Films for Microwave Applications

Published online by Cambridge University Press:  26 February 2011

David W. Reagor
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM 87545.
Margarita E. Piza
Affiliation:
Dept. Materials Science, Massachussetts Institute of Technology
Robert J. Houlton
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM 87545.
Fernando H. Garzon
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM 87545.
Marilyn Hawley
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM 87545.
Ian D. Raistrick
Affiliation:
Los Alamos National Laboratory, Los Alamos, NM 87545.
Get access

Abstract

The residual surface resistance of a number of films of YBa2Cu3O7−x, prepared by off-axis sputtering onto MgO substrates, has been measured using a parallel-plate resonator technique. Deposition conditions were kept constant, apart from the substrate temperature. There is no correlation between surface resistance and other important microscopic parameters, such as Tc and c-axis lattice parameter. There is, however, a trend to higher Rs with increasing volume fraction of in-plane misoriented material, although the correlation is not perfect. Furthermore, we have found that most of the misoriented material is localized at the film substrate interface and, therefore, is probably not responsible for most of the RF losses. The data suggest that at higher deposition temperatures, there is an increasing tendency for 45° misoriented material to appear in the films, and a significant fraction of this material may be present closer to the free film surface. Scanning Tunneling Microscopy (STM) qualitatively supports this conclusion.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Laderman, S. S., Taber, R. C., Jacowitz, R. D., Moll, J. L., Eom, C. B., Hylton, T. L., Marshall, A. F., Geballe, T. H., and Beasley, M. R., “Resistive loss at 10 GHz in c-axis-aligned in-situ-grovm YBa2Cu3O7−x, films,” Rev. 43, 2922 (1991).CrossRefGoogle Scholar
2. Eom, E. B., Sun, J. Z., Lairson, B. M., Streiffer, S. K., Marshall, A. F., Yamamoto, K., “Synthesis and properties of YBa2Cu3O7 thin films grown in situ by 90° off-axis single magnetron sputtering,” Physica C 171, 354 (1990).CrossRefGoogle Scholar
3. Enprotech Corp., 1 Station Square, Suite 620, Pittsburgh, P. A. 15219.Google Scholar
4. Tabor, R. C., “A parallel plate resonator technique for microwave loss measurements on superconductors,” Rev. Sci. Instr., 61, 2200 (1990).CrossRefGoogle Scholar
5. Halbritter, J.RF residual losses, surface impedance, and granularity in superconducting cuprates,” J. Appl. Phys, 68, 6315 (1990).CrossRefGoogle Scholar
6. Raistrick, Ian. D., Hawley, Marilyn, Beery, Jerome, Garzon, Fernando and Houlton, Robert J.Microstructure and growth mechanism of thin sputtered films of YBa2Cu3O7 on MgO substrates,” Appl. Phys. Lett, 59, 3177 (1991).CrossRefGoogle Scholar

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Microstrucrure and Properties of In-Situ R. F. Sputtered YBa2Cu3O7−x Thin Films for Microwave Applications
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Microstrucrure and Properties of In-Situ R. F. Sputtered YBa2Cu3O7−x Thin Films for Microwave Applications
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Microstrucrure and Properties of In-Situ R. F. Sputtered YBa2Cu3O7−x Thin Films for Microwave Applications
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *