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Measurements of Liquid Silicon Resistivity on Silicon Microwires

Published online by Cambridge University Press:  31 January 2011

Gokhan Bakan
Affiliation:
gokhan@engr.uconn.edu, University of Connecticut, Electrical & Computer Engineering, Storrs, Connecticut, United States
Kadir Cil
Affiliation:
kadir.cil@uconn.edu, University of Connecticut, Electrical & Computer Engineering, Storrs, Connecticut, United States
Adam Cywar
Affiliation:
adam.cywar@gmail.com, University of Connecticut, Electrical & Computer Engineering, Storrs, Connecticut, United States
Helena Silva
Affiliation:
silva@engr.uconn.edu, University of Connecticut, Electrical & Computer Engineering, Storrs, Connecticut, United States
Ali Gokirmak
Affiliation:
gokirmak@engr.uconn.edu, University of Connecticut, Electrical & Computer Engineering, Storrs, Connecticut, United States
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Abstract

Nanocrystalline silicon microwires are self-heated through microsecond voltage pulses. Nonlinear changes in current level are observed during the voltage pulse, which end with melting of the microwires. Liquid silicon resistivity is extracted as 65.9 ± 6.1 μΩ.cm from the minimum resistance of the wire during the voltage pulse. The extracted resistivity is in good agreement with previously reported values.

Type
Research Article
Copyright
Copyright © Materials Research Society 2009

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References

1 Wagner, S. Gleskova, H. Cheng, I. C. and Wu, M. Thin Solid Films 430, 15(2003).CrossRefGoogle Scholar
2 Reuss, R. H. Chalama, B. R. Moussessian, A. Kane, M. G. Kumar, A. Zhang, D. C. Rogers, J. A. Hatalis, M. Temple, D. Moddel, G. Eliasson, B. J. Estes, M. J. Kunze, J. Handy, E. S. Harmon, E. S. Salzman, D. B. Woodall, J. M. Alam, M. A. Murthy, J. Y. Jacobsen, S. C. Olivier, M. Markus, D. Campbell, P. M. and Snow, E. Proc IEEE 93, 12391256 (2005).CrossRefGoogle Scholar
3 Sposili, R. S. and Im, J. S. Appl. Phys. Lett. 69, 2864(1996).CrossRefGoogle Scholar
4 Sameshima, T. Andoh, N. and Takahashi, H. J. Appl. Phys. 89, 5362(2001).CrossRefGoogle Scholar
5 Andoh, N. Sameshima, T. and Kitahara, K. Thin Solid Films 487, 118(2005).CrossRefGoogle Scholar
6 Bakan, G. Cywar, A. Silva, H. and Gokirmak, A. Appl. Phys. Lett. (accepted, 2009).Google Scholar
7 Bakan, G. Cywar, A. Boztug, C. Akbulut, M. Silva, H. and Gokirmak, A. Mater. Res. Soc. Symp. Proc. 1144, LL0325 (2009).Google Scholar
8 Streetman, B. G. Solid State Electronic Devices, 4th edn. (Prentice Hall, 1995).Google Scholar
9 Glazov, V. M. Chizhevskaya, S. N. and Glagoleva, N. N. Liquid Semiconductors, (Plenum Press, N.Y., 1969), p. 362.CrossRefGoogle Scholar
10 Sasaki, H. Ikari, A. K. Terashima and Kimura, S. Jpn. J. Appl. Phys 34, 34263431 (1995).CrossRefGoogle Scholar
11 Schnyders, H. S. and Zytveld, J. B. Van, Journal of Physics: Condensed Matter 8, 10875(1996).Google Scholar
12Cornell NanoScale Science and Technology Facility.Google Scholar

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