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Iron substituted SrRuO3 thin films

Published online by Cambridge University Press:  01 February 2011

Aman Ullah
Affiliation:
ullah.aman@gmail.com, Northern Illinois University, Physics, 202 Faraday West, Dekalb, IL, 60115, United States, (815) 753-1772, (815) 753-8565
Young Zo Yoo
Affiliation:
yzyoo@phys.niu.edu, Northern Illinois University, Institute of NanoScience, Engineering and Technology (INSET), Physics, Dekalb, IL, 60115, United States
Omar Chmaissem
Affiliation:
chmaissem@anl.gov, Northern Illinois University, Institute of NanoScience, Engineering and Technology (INSET), Physics, Dekalb, IL, 60115, United States
Stanislaw Kolesnik
Affiliation:
kolesnik@physics.niu.edu, Northern Illinois University, Institute of NanoScience, Engineering and Technology (INSET), Physics, Dekalb, IL, 60115, United States
Bogdan Dabrowski
Affiliation:
dabrowski@anl.gov, Northern Illinois University, Institute of NanoScience, Engineering and Technology (INSET), Physics, Dekalb, IL, 60115, United States
Genis Alan
Affiliation:
genis@ceet.niu.edu, Northern Illinois University, Institute of NanoScience, Engineering and Technology (INSET), Electrical Engineering, Dekalb, IL, 60115, United States
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Abstract

Fe-doped SrRuO3 thin films were grown on SrTiO3 (STO) substrates by using the Pulse Laser Deposition (PLD) method. Fe concentrations in the SrRuO3 thin films ranged from 0 % to 11 % to manifest the effect of Fe doping on their microstructure. Lattice constants of the films did not show obvious changes with the Fe doping whereas surface morphologies drastically changed from stepped to island structure with increasing Fe. X-ray reflectivity revealed that the surface and interfacial roughness decreased with increasing concentration of Fe. Surface roughness of the films was confirmed by atomic force microscopy. Therefore, a precise determination of film roughness as well as its growth mechanism using X-ray and AFM is exploited to correlate the Fe doping with structural disorder.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

REFERENCES

[1] Yoo, Y. Z., Chmaissem, O., Kolesnik, S., Ullah, A., Lurio, L. B., Brown, D. E., Brady, J., Dabrowski, B., Kimball, C. W., Haji-Sheikh, M., and Genis, A. P., Applied Physics Letters 89 (2006)Google Scholar
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