No CrossRef data available.
Article contents
Ir/Au Ohmic Contacts on Bulk, Single-Crystal n-Type ZnO
Published online by Cambridge University Press: 15 March 2011
Extract
Purpose: Need for reliable, thermally stable Ohmic metallizations for ZnO. Because of difficulties with current common contact metals, there exists a heavy desire for metals with high melting temperatures and low reactivities.
- Type
- Research Article
- Information
- MRS Online Proceedings Library (OPL) , Volume 1000: Symposium L – Functional Interfaces in Oxides , 2007 , 1000-L06-17
- Copyright
- Copyright © Materials Research Society 2007
References
Literature cited
2.
Kang, B.S., Kim, S., Roche, J.R. La, Ren, F., J. Vac. Sci. Technol. B
22, 2635 (2004).10.1116/1.1814111Google Scholar
4.
Claflin, B., Look, D.C., Park, S.J. and Cantwell, G., J. Crystal Growth,
287, 16 (2006).10.1016/j.jcrysgro.2005.10.035Google Scholar
5.
Limpijumnong, S., Zhang, S.B., Wei, S.-H. and Park, C.H., Phys. Rev. Lett.
92
155504 (2004).10.1103/PhysRevLett.92.155504Google Scholar
6.
Pearton, S. J., Norton, D.P., Ip, K., Heo, Y.W., and Steiner, T., Prog. in Mater. Sci.
50, 293 (2005).10.1016/j.pmatsci.2004.04.001Google Scholar
7.
Yi, G-C., Wang, C., and Park, W. I., Semicond. Sci. Technol.
20, S22 (2005).10.1088/0268-1242/20/4/003Google Scholar
8.
Padovani, F.A. and Stratton, R., Solid-State Electron. 9
695 (1966).10.1016/0038-1101(66)90097-9Google Scholar
9.
Makino, T., Segawa, Y., Kawasaki, M. and Koinuma, H., Semicond.Sci.Technol.
20
S78 (2005).10.1088/0268-1242/20/4/010Google Scholar
10.
Alivov, Ya.I., Kalinina, E.V., Cherenkov, A.E., Look, D.C., Ataev, B.M., Omaev, A.K., Chukichev, M.V., and Bagnall, D.M., Appl. Phys. Lett.
83, 4719 (2003).10.1063/1.1632537Google Scholar
11.
Osinsky, A., Dong, J.W., Kauser, M.Z., Hertog, B., Dabiran, A.M., Chow, P.P., Pearton, S.J., Lopatiuk, O., and Chernyak, L., Appl. Phys. Lett.
85, 4272 (2004).10.1063/1.1815377Google Scholar