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In-situ TEM observation of electromagnetic field in some real materials

Published online by Cambridge University Press:  26 February 2011

Katsuhiro Sasaki
Affiliation:
khsasaki@hix.nagoya-u.ac.jp, Nagoya University, Quantum Engineering, Furo-cho, Chikusa-Ku, Nagoya, N/A, N/A, Japan, +81-52-789-3350, +81-52-789-3226
Zhouguang Wang
Affiliation:
wangzg@jfcc.or.jp, Japan Fine Ceramics Center, Japan
Keiichi Fukunaga
Affiliation:
fukunaga@jfcc.or.jp, Japan Fine Ceramics Center, Japan
Tsukasa Hirayama
Affiliation:
hirayama@jfcc.or.jp, Japan Fine Ceramics Center, Japan
Kotaro Kuroda
Affiliation:
kuroda@nagoya-u.jp, Nagoya University, Quantum Engineering, Japan
Hiroyasu Saka
Affiliation:
saka@nagoya-u.jp, Nagoya University, Quantum Engineering, Japan
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Abstract

Electromagnetic fields presents in some real materials have been observed using electron holography and a simple method named the Shadow Image Distortion (SID) method which we have developed. The in-situ electron holography observation of the electric field surrounding a ceramic particle showed the rapid degradation of dielectric properties of the particle at an elevated temperature. The cross sectional view of mean electrostatic potential distributions in a silicon device has been observed. In-situ electron holography and SID observations showed the electrostatic potential distribution across a reverse biased p-n junction in a compound semiconductor. The SID method using a dedicated tool allowed single-step imaging of 2D maps of electromagnetic field.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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References

1 Wang, Z. G., Kato, N., Sasaki, K., Hirayama, T. and Saka, H., Journal of electron microscopy 53, 115119 (2004).Google Scholar
2 Tonomura, A., Rev. Mod. Phys. 59, 639669 (1987)Google Scholar
3 Chapman, J. N.: J. Phys. D 17, 623647 (1984).Google Scholar
4 Sasaki, K. and Saka, H., “A Simple method of the electric/magnetic field observation by a conventional transmission electron microscope”, Materials Science Forum Vol.475–479, ed. Zhong, Z.Y., Saka, H., Kim, T.H., Holm, E.A., Han, Y.F. and Xie, X.S. (Trans Tec Pub., 2005) pp.40294034. (available on http://www.scientific.net/default.cfm?pdf=1ppg=921&paper=4029&isbn=0-87849-960-1 or will be soon available on http://hdl.handle.net/2237/5299).Google Scholar
5 Hirayama, T., Materials Characterization 42, 193200 (1999).Google Scholar
6 Tsukimoto, S., Sasaki, K., Hirayama, T. and Saka, H., Phil. Mag. Lett., 76, 173179 (1997).Google Scholar
7 Rau, W. D., Schwander, P., Baumann, F. H., Hoppner, W., and Ourmazd, A., Phys. Rev. Lett. 82, 26142617 (1999).Google Scholar
8 Gribelyuk, M. A., McCartney, M. R., Li, J., Murthy, C. S., Ronsheim, P., Doris, B., McMurray, J. S., Hegde, S., and Smith, D. J., Phys. Rev. Lett. 89, 025502–1-4 (2002).Google Scholar
9 Twitchett, A. C., Dunin-Borkowski, R. E., and Midgley, P. A., Phys. Rev. Lett. 88, 238302–1-4 (2002).Google Scholar
10 Twitchett, A. C., Dunin-Borkowski, R. E., Hallifax, R.J., Broom, R. F. and Midgley, P. A., Journal of Microscopy, 214, 287296 (2004).Google Scholar
11 Wang, Z., Sasaki, K., Hirayama, T., Yabuuchi, Y. and Saka, H., Microscopy and Microanalysis 9, supplement, 772773 (2003).Google Scholar
12 Kamino, T. and Saka, H., Microsc. Microanal. Microstruct., 4, 127135 (1993).Google Scholar
13 Sasaki, K., Wang, Z., Hirayama, T., Yabuuchi, Y., Saka, H., Electron Microscopy 38 (in Japanese) 216218 (2003).Google Scholar
14 Sasaki, K., Kato, N., Miyashita, K., Wang, Z., Hirayama, T., Saka, H., Electron Microscopy 35 supplement 1 (in Japanese) 190 (2000).Google Scholar
15 Marton, L. and Lachenbruch, H., J. Appl. Phys. 20, 11711182 (1949).Google Scholar
16 Jakubovics, J. P., Phil. Mag. 10, 675694 (1964).Google Scholar