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In-Situ Scanning Probe Microscopy of Solid-Liquid Interfaces: Role of Epitaxial Oxide Adlayers on Cu Electrodeposition

Published online by Cambridge University Press:  21 February 2011

John R. LaGraff
Affiliation:
Department of Chemistry, Materials Research Laboratory, The University of Illinois at Urbana- Champaign, Urbana, IL 61801
Andrew A. Gewirth
Affiliation:
Department of Chemistry, Materials Research Laboratory, The University of Illinois at Urbana- Champaign, Urbana, IL 61801
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Abstract

We discuss how the nanoscale structural and chemical properties of copper (Cu) single crystal surfaces immersed in acidic aqueous solutions affect local electrochemical function. In particular, perturbation of oxide adlayers with in-situ atomic force microscopy (AFM) is shown to locally enhance the electrochemical deposition of Cu on Cu electrode surfaces. The results are consistent with a heterogeneous nucleation and growth mechanism in which the tip-sample interaction creates surface defect sites in passivating oxide adlayers which are active towards the electrochemical adsorption of Cu species. This “protect-deprotect-react” scheme enables precise control of feature sizes and allows this technique to be used for fabrication and constructive modification of solid-liquid interfaces.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

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References

[1] West, J.M., Electrodeposition and Corrosion Processes; Van Nostrana Reinhold: New York, 1971;Google Scholar
Winand, R., Trans. Sec. C Inst. Min. Metall. 84, 67 (1975).Google Scholar
[2] See Mater. Res. Soc. Bull, 18, pp. 1856 (1993).CrossRefGoogle Scholar
[3] Siegenthaler, H., in Scanning Tunneling Microscopy II; Wiesendanger, R., Guntherodt, H.J., Eds.; Springer-Verlag: New York, 1992; vol. 28; Chp. 2;CrossRefGoogle Scholar
NATO Proceedings: Nanoscale Probes of the Solid/Liquid Interface; Siegenthaler, H., Gewirth, A.A., Eds.; Kluwer Academic Publishers: Dordecht, The Netherlands; (In press, 1995).Google Scholar
[4] Cruickshank, B., Sneddon, D.D., Gewirth, A.A., Surf. Sci. 281, L308 (1993).CrossRefGoogle Scholar
[5] LaGraff, J.R., Gewirth, A.A., Surf. Sci. Lett, (in press, 1995).Google Scholar
[6] LaGraff, J.R., Cruickshank, B., Gewirth, A.A., Mat. Res. Soc. Proc. 332, 121 (1994).CrossRefGoogle Scholar
[7] LaGraff, J.R., Gewirth, A.A., J. Phys. Chem. 98, 11246 (1994).CrossRefGoogle Scholar
[8] LaGraff, J.R., Gewirth, A.A., (manuscript in preparation).Google Scholar
[9] Vilche, J.R., Juttner, K., Electrochem. Acta 32, 1567 (1987).CrossRefGoogle Scholar
[10] Nichols, R.J., Kolb, D.M., Behm, R.J., J. Electroanal. Chem. 313, 109 (1991).CrossRefGoogle Scholar
[11] Kepler, K.D., Gewirth, A.A., Surf. Sci. 303, 101 (1994).CrossRefGoogle Scholar
[12] Deposits on the (111) and (100) surface often possessed similar epitaxial orientations to the underlying substrate.Google Scholar
[13] Mamin, H.J., Rugar, D., Appl. Phys. Lett. 61, 1003 (1992);CrossRefGoogle Scholar
Leung, O.M., Goh, M.C., Science 255, 64 (1992);CrossRefGoogle Scholar
Delawski, E., Parkinson, B.A., J. Am. Chem. Soc. 114, 1661 (1992);CrossRefGoogle Scholar
Kim, Y., Lieber, C.M., Science 257, 375 (1992).CrossRefGoogle Scholar
[14] Brumfield, J.C., Goss, C.A., Irene, E.A., Murray, R.W., Langmuir, 2810 (1992).CrossRefGoogle Scholar
[15] Chen, L., Guay, D., J. Electrochem. Soc. 141, L43 (1994).CrossRefGoogle Scholar
[16] LaGraff, J.R., Gewirth, A.A., (unpublished results).Google Scholar
[17] Pourbaix, M., Atlas of Electrochemical Equilibria in Aqueous Solutions; Pergamon Press: New York, 1966; p. 387.Google Scholar
[18] Bradley, R.A. et al., J. Electroanal. Chem. 309, 319 (1991).CrossRefGoogle Scholar
[19] Besenbacher, F., Norskov, J.K., Prog, in Surf. Sci. 44, 5 (1993).CrossRefGoogle Scholar
[20] Becker, R.S., Golovchenko, J.A., Swartzentruber, B.S., Nature 325, 419 (1987);CrossRefGoogle Scholar
Lyo, I., Avouris, P., Science 253, 173 (1991);CrossRefGoogle Scholar
Eigler, D.M., Schweizer, E.K., Nature 344, 524 (1990);CrossRefGoogle Scholar
Huang, J.L., Sung, Y.E., Lieber, C.M., Appl. Phys. Lett 61, 1528 (1992);CrossRefGoogle Scholar
Garfunkel, E., et al. Science 246, 99 (1989);CrossRefGoogle Scholar
Sato, A., Tsukamoto, Y., Nature 363, 431 (1993);CrossRefGoogle Scholar
Kobayashi, A., Grey, F., Williams, R.S., Aono, M., Science 259, 1724 (1993).CrossRefGoogle Scholar
[21] Schoer, J.K., Ross, C.B., Crooks, R.M., Corbitt, T.S., Hampden-Smith, M.J., Langmuir 10, 615 (1994).CrossRefGoogle Scholar
[22] Staufer, U., in Scanning Tunneling Microscopy II; Wiesendanger, R., Guntherodt, H.J., Eds.; Springer-Verlag: New York, 1992; vol. 28; Chp. 8.CrossRefGoogle Scholar
[23] Lin, Ch.W., Fan, F.R.F., Bard, A.J., J. Electrochem. Soc. 134, 1038 (1987);CrossRefGoogle Scholar
Nagahara, L.A., Thundat, T., Lindsay, S.M., Appl. Phys. Lett. 57, 270 (1990).CrossRefGoogle Scholar
[24] Schneir, J., Hansma, P.K., Langmuir 3, 1025 (1987).CrossRefGoogle Scholar
[25] Li, W., Virtanen, J.A., Penner, R.M., Appl. Phys. Lett. 60, 1181 (1992);CrossRefGoogle Scholar
Li, W., Virtanen, J.A., Penner, R.M., J. Phys. Chem. 96, 6529 (1992).CrossRefGoogle Scholar
[26] JRL acknowledges a National Science Foundation Postdoctoral Fellowship in Chemistry (CHE-9302406). AAG acknowledges a Presidential Young Investigator Award (CHE-9027593) with matching funds provided by Digital Instruments, Inc. This work was funded by the Department of Energy (DE -FG02–91ER45349) through the Materials Research Laboratory at the University of Illinois.Google Scholar

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In-Situ Scanning Probe Microscopy of Solid-Liquid Interfaces: Role of Epitaxial Oxide Adlayers on Cu Electrodeposition
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