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Influence of the grain boundaries on conductivity of yttrium stabilized zirconia

Published online by Cambridge University Press:  01 February 2011

V. Petrovsky ,
P. Jasinski ,
H.U. Anderson  and
T. Petrovsky
V. Petrovsky
Affiliation:
University Missouri-Rolla, EMARC, USA
P. Jasinski
Affiliation:
University Missouri-Rolla, EMARC, USA
H.U. Anderson
Affiliation:
University Missouri-Rolla, EMARC, USA
T. Petrovsky
Affiliation:
University Missouri-Rolla, EMARC, USA
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Abstract

The influence of the grain boundaries on the ionic conductivity of yttrium stabilized zirconia (YSZ) was investigated. The initially nanocrystalline samples were prepared using a tape casting process. The samples were annealed at different temperatures in the range from 1000 to 1400°C to overlap the grain size from 100nm to ∼10μm and investigated using impedance spectroscopy. Two distinct semicircles were found on all YSZ samples corresponding to the influence of the grain and grain boundary on the resistance. The activation energies for both resistances are very close (1.00 and 1.03eV correspondingly). The grain resistance does not change significantly during the annealing process, but the grain boundary resistance decreases after high temperature annealing which causes a decrease in the overall resistance of the material. The calculations show that the decrease in the grain boundary resistance is connected only with the increase in the grain size and the specific grain boundary resistance (per unit surface area of grain boundary) does not change with annealing.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 835: Symposium K – Solid-State Ionics , 2004 , K7.9
Copyright
Copyright © Materials Research Society 2005

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References

REFERENCES

1. Singhal, S.C., MRS Bulletin 25, 16–21, (2000).Google Scholar
2. Steele, B.C.H., Journal of Materials Science, 36, 1053–1068 (2001).Google Scholar
3. Jiang, Yi and Virkar, Anil V., of Electrochem. Soc., 148 (7), A706–A709 (2001).Google Scholar
4. Park, Seungdoo, Gorte, Raymond J., and Vohs, John M., J. Electrochem. Soc., 148 (5), A443 (2001).Google Scholar
5. Pal, U., Singhal, S.C., J. Electrochem. Soc., 137, 2937 (1990).Google Scholar
6. Wang, L.S., Thiele, E.S., Barnett, S.A., Sol. St. Ionics, 52 (1–3) 261 (1992).Google Scholar
7. Kosacki, I., Suzuki, T., Petrovsky, V., Anderson, H.U., Sol.St. Ionics, 136–137, 1225 (2000).Google Scholar
8. Wang, C., Worrell, W.L., Park, S., Vohs, J.M., Gorte, R.J., J. Electrochem. Soc., 148 (8),. A.864 (2001).Google Scholar
9. Will, J., Mitterdorfer, A., Kleinlogel, C., Perednis, D., Gaucler, L.J., Sol. St. Ionics, 131, 79 (2000).Google Scholar
10. Kostogloudis, G. Ch., Tsiniarakis, G., Ftikos, Ch., Sol. St. Ionics, 135(1–4), 529 (2000).Google Scholar
11. Petrovsky, V., Anderson, H.U., Petrovsky, T., Low temperature Technologies for SOFC, Proceedings of the International Symposium “Solid Oxide Fuel Cells VIII (SOFC VIII), Volume 2003-01, The Electrochemical Society, Paris, 976 (2003).Google Scholar
12. Petrovsky, T., Anderson, H.U., Petrovsky, V., Mat. Res. Soc. Proceedings, 756, 515 (2003).Google Scholar
13. Petrovsky, V., Anderson, H.U., Petrovsky, T., Bohannan, E., Mat. Res. Soc. Proceedings, 75, 503 (2003).Google Scholar
14. Anderson, H.U. and Petrovsky, V., Proceedings of Fifth European Solid Oxide Fuel Cell Forum, 1, Zurich, Switzerland, 240 (2002).Google Scholar
15. Petrovsky, V., Anderson, H.U., Petrovsky, T., Mat. Res. Soc. Proceedings, Solid State Ionics -2003, to be published (2004).Google Scholar
16. Schouler, E.J.L., Mesbahi, N., and Vitter, G., Sol. St. Ionics, 9–10, 989 (1983).Google Scholar
17. Badwal, S.P.S., and Dernnan, J., J. Mater. Sci., 22, 3231 (1987).Google Scholar
18. Badwal, S.P.S., Appl.Phys. A, 50, 449 (1990).Google Scholar
19. Badwal, S.P.S., Sol. St. Ionics, 76, 67 (1995).Google Scholar
20. Steil, M.C., Thevenot, F., and Kleitz, M., J. Electrochem. Soc., 144, N1, 390 (1997).Google Scholar
21. Steele, B.C.M., and Heinzel, A., Nature, 414, 345 (2001).Google Scholar
22. Guo, X., Sigle, W., Fleig, J., Maier, J., Sol. St. Ionics, 154–155, 555 (2002).Google Scholar