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Grazing Incidence X-ray Diffraction Studies of Thin Films at the air-liquid Interface

Published online by Cambridge University Press:  21 March 2011

Coralie Alonso ,
Anne Renault ,
Meir Lahav  and
Leslie Leiserowitz
Coralie Alonso
Affiliation:
Weizmann Institute of Science, ‘Materials and Interfaces’ Dpt, Rehovot 76100, Israel
Anne Renault
Affiliation:
Universite Rennes I, ‘Matiere Condensee et Materiaux’ Dpt, Rennes 35042, France
Meir Lahav
Affiliation:
Weizmann Institute of Science, ‘Materials and Interfaces’ Dpt, Rehovot 76100, Israel
Leslie Leiserowitz
Affiliation:
Weizmann Institute of Science, ‘Materials and Interfaces’ Dpt, Rehovot 76100, Israel
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Abstract

Monomolecular films at the air-water interface can be investigated on the subnanometer scale with grazing incidence X-ray diffraction (GIXD) using synchrotron radiation. This surface semsitive technique utilizes the property of total external reflection of X-rays from a water surface : an evanescent wave generated within the film diffracts in the surface plane giving an image of the film reciprocal lattice. Three applications of GIXD are presented ranging from poorly to highly crystalline thin films. (i) Cholesteryl-L-glutamate forms a crystalline monolayer at the air-water interface within which the glutamate moieties are not closely packed. This system specifically incorporates hydrophobic amino acids from the subphase. (ii) Long-chain cholesteryl esters deposited on the water surface spontaneously self assemble, forming crystalline interdigitated bilayers. The molecular structure, solved at the atomic resolution, was found to be similar to the 3D counterpart. (iii) According to 2-D diffraction theory, the shape of Bragg peaks is related to the mechanical constants of the film. Rigidity of the film can be deduced from a detailed peak analysis for secondary short chain alcohols showing a softening of the monolayer close to melting.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 678: Symposia EE – Applications of Synchrotron Radiation Techniques…IV , 2001 , EE9.10.1
Copyright
Copyright © Materials Research Society 2001

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