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Grain Boundary Curvature in Polycrystalline Metallic Thin Films

Published online by Cambridge University Press:  14 March 2011

Alexander H. King
Affiliation:
School of Materials Engineering, Purdue University, West Lafayette IN 47907-1289.
Rakesh Mangat
Affiliation:
Massachusetts Institute of Technology, Cambridge, MA, 02139
Kwame Owusu-Boahen
Affiliation:
Department of Materials Science & Engineering, State University of New York, Stony Brook NY 11794-2275
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Abstract

Well-annealed thin films are typically observed to exhibit mean grain diameters that are approximately equal to the film thickness. The standard explanation of this “sheet thickness effect” is that it results from a balance of grain boundary curvature in two different directions which, in turn, results from pinning at grain boundary grooves. TEM experiments have been performed to assess this model, and it is found that the predicted curvature about axes in the film plane is absent. Alternate explanations of the sheet thickness effect are considered.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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