Skip to main content Accessibility help
×
Home
Hostname: page-component-684899dbb8-bjz6k Total loading time: 0.27 Render date: 2022-05-20T11:25:40.173Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "useRatesEcommerce": false, "useNewApi": true }

Fine Structure of Sputtered Ni/Ti Multilayered Thin Films Studied by HREM

Published online by Cambridge University Press:  15 February 2011

M. J. Casanove
Affiliation:
Cemes - Loe, CNRS, B.P. 4347, 31055 Toulouse cedex, France.
E. Snoeck
Affiliation:
Cemes - Loe, CNRS, B.P. 4347, 31055 Toulouse cedex, France.
C. Roucau
Affiliation:
Cemes - Loe, CNRS, B.P. 4347, 31055 Toulouse cedex, France.
J. L. Hutchison
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford OX1 3PH, U.K.
Z. Jiang
Affiliation:
Faculté des Sciences de St. Jérôme, 13397 Marseille cedex, France.
B. Vidal
Affiliation:
Faculté des Sciences de St. Jérôme, 13397 Marseille cedex, France.
Get access

Abstract

Ni/Ti multilayered thin films can be efficient neutron guides and are therefore of great interest in neutron optics. Ni/Ti and NiC/Ti multilayers with various layer thicknesses were fabricated by magnetron sputtering and characterized by high resolution transmission electron microscopy (TEM). The TEM studies, performed on cross-sectional specimens, revealed that both kinds of layers were textured and snowed coherence in the growth direction. The presence of a 2 nra thick amorphous zone at the Ni/Ti interface in the carbon free thin films was also confirmed. On the contrary, sharp interfaces were obtained in NiC/Ti multilayers. The fine structure of the different layers will also be reported.

Type
Research Article
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1 Sdaq, A., Broto, J.M., Rakoto, H., Ousset, J.C., Raquet, B., Vidal, B., Jiang, Z., Bobo, J.F., Piecuch, M. and Baylac, B., J. Magn. Magn. Mater. 121, 409 (1993).CrossRefGoogle Scholar
2 Clemens, B. M., Phys. Rev. B 33, 7615 (1985).CrossRefGoogle Scholar
3 Elsenhans, O., Boni, P., Friedli, H.P., Grimmer, H., Buffat, P., Leifer, K. and Anderson, I. SPIE 1738, 130 (1992).Google Scholar
4 Jiang, Z., Vidal, B., Brunei, M., Maaza, M., Samuel, F., SPIE 1738, 141 (1992).Google Scholar
5 Petford-long, A.K., Donovan, P.E. and Heys, A. Ultramiscroscopy 47, 323 (1992)CrossRefGoogle Scholar
6 Porte, M., Lassri, H., Krishnan, R., Kaabouchi, M., Maaza, M. and Sella, C., Appl. Surf. Science 6566, 131 (1993)CrossRefGoogle Scholar
7 Sella, S., Maaza, M., Kaabouchi, M., El Monkade, S., Miloche, M. and Lassri, H., J. Magn. Magn. Mat. 121, 201 (1993).CrossRefGoogle Scholar
8 Bertero, G.A., Hufnagel, T.C., Clemens, B.M. and Sinclair, R., J. Mater. Res. 8, 771 (1993).CrossRefGoogle Scholar

Save article to Kindle

To save this article to your Kindle, first ensure coreplatform@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about saving to your Kindle.

Note you can select to save to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be saved to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Fine Structure of Sputtered Ni/Ti Multilayered Thin Films Studied by HREM
Available formats
×

Save article to Dropbox

To save this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Dropbox account. Find out more about saving content to Dropbox.

Fine Structure of Sputtered Ni/Ti Multilayered Thin Films Studied by HREM
Available formats
×

Save article to Google Drive

To save this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you used this feature, you will be asked to authorise Cambridge Core to connect with your Google Drive account. Find out more about saving content to Google Drive.

Fine Structure of Sputtered Ni/Ti Multilayered Thin Films Studied by HREM
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *