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Extending AFM Phase Image of Nanocomposite Structures to 3D using FIB
Published online by Cambridge University Press: 27 February 2012
Abstract
The mechanical behavior of nanocomposites is critically dependent on their structural composition. In this paper we use Focused Ion Beam (FIB) microscopy to prepare surfaces from a layered polymer nanocomposite for investigation using phase contrast atomic force microscopy (AFM). Phase contrast AFM provides mechanical information on the surface examined and, by combining with the sequential cross-sectioning of FIB, can extend the phase contract AFM into three dimensions.
- Type
- Research Article
- Information
- MRS Online Proceedings Library (OPL) , Volume 1421: Symposium PP – Three-Dimensional Tomography of Materials , 2012 , mrsf11-1421-pp07-09
- Copyright
- Copyright © Materials Research Society 2012
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