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Enhanced Light Absorption in a-Si:H Layers of Solar Cells by Applying Tco/Metal Back Contacts

Published online by Cambridge University Press:  01 January 1993

G. Tao
Affiliation:
Delft University of Technology, P.O.Box 5031, 2600 GA Delft, the Netherlands
B.S. Girwar
Affiliation:
Delft University of Technology, P.O.Box 5031, 2600 GA Delft, the Netherlands
G.E.N. Landweer
Affiliation:
Delft University of Technology, P.O.Box 5031, 2600 GA Delft, the Netherlands
M. Zeman
Affiliation:
Delft University of Technology, P.O.Box 5031, 2600 GA Delft, the Netherlands
J.W. Metselaar
Affiliation:
Delft University of Technology, P.O.Box 5031, 2600 GA Delft, the Netherlands
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Abstract

The optimization of the back contact reflectivity for thin film a-Si:H solar cells has been performed. The results of optical calculations show that a-Si:H/TCO/Metal interfaces with a proper TCO thickness reflect much more than their a-Si:H/Metal counterparts. We compared solar cells which were deposited on a flat substrate with different back contacts. The back contacts consisted of a metal layer (aluminum, silver/aluminum) or combined TCO/metal layers (TCO/Al, TCO/Ag/Al). The same was done with solar cells which were deposited on a textured substrate. The solar cells with a TCO/metal back contact showed not only a significantly increased short-circuit current density but also an increase in the spectral response. The cells with TCO/Ag/Al back contact showed the best result.

Type
Research Article
Copyright
Copyright © Materials Research Society 1993

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References

1. Walker, C., Hollingsworth, R.E., Cueto, J. del, and Madan, A., in: Mater. Res. Soc. Proc. Vol. 70, (1986) Materials Research Society, pp. 563568.CrossRefGoogle Scholar
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3. Linden, M.B.von der, Schropp, R.E.I., van Sark, W.G.J.H.M., Zeman, M., Tao, G., and Metselaar, J.W., in: the proceedings of the 11th EPVSEC, edited by Guimaraes, L.J.M. et.al., 1992.Google Scholar
4. Tao, G., Zeman, M., and Metselaar, J.W., this conference.Google Scholar
5. Tao, G., Girwar, B.S., Landweer, G.E.N., Zeman, M., and Metselaar, J.W., in: the proceedings of the 11th EPVSEC, edited by Guimaraes, L.J.M. et.al., 1992.Google Scholar
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