Skip to main content Accessibility help
×
Home
Hostname: page-component-55b6f6c457-hjh89 Total loading time: 0.32 Render date: 2021-09-28T14:57:12.731Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true, "newUsageEvents": true }

Effect of Interface Roughness on Light Scattering and Optical Properties of a-Si:H Solar Cells

Published online by Cambridge University Press:  15 February 2011

M. Zeman
Affiliation:
Delft University of Technology - DIMES, P.O. Box 5053, 2600 GB Delft, The Netherlands, m.zeman@its.tudelft.nl
R.A.C.M.M. Van Swaau
Affiliation:
Delft University of Technology - DIMES, P.O. Box 5053, 2600 GB Delft, The Netherlands
M. Zuiddam
Affiliation:
Delft University of Technology - DIMES, P.O. Box 5053, 2600 GB Delft, The Netherlands
J.W. Metselaar
Affiliation:
Delft University of Technology - DIMES, P.O. Box 5053, 2600 GB Delft, The Netherlands
R.E.I. Schropp
Affiliation:
Utrecht University, Debye Institute, P.O. Box 80 000, 3508 TA Utrecht, The Netherlands
Get access

Abstract

The effect of interface roughness on the optical properties of amorphous silicon (a-Si:H) solar cells was investigated using rms roughness measurements and computer modeling. We deposited four single junction a-Si:H solar cells on Asahi U type substrate each with a different intrinsic layer thickness. The roughness of the substrate and of the subsequent interfaces of the cells was measured by Atomic Force Microscopy. The relations between the computer input parameters, which describe the diffuse part of reflected and transmitted light at a rough interface, and the rms roughness of the interfaces in a-Si:H solar cell are presented. After obtaining a good matching between the simulated and measured external quantum efficiencies (QE) of the four cells, we investigated the effect of interface roughness on the absorption in all individual layers of the a-Si:H solar cell using the determined scattering parameters.

The rms roughness of the Asahi U-type substrate surface is determined to be 40 nm. Deposition of a 9 nm thick p-type a-SiC:H layer on the substrate has not changed the surface roughness. Due to a high refractive index of n-type a-Si:H the back contact interface acts as a nearly perfect diffuser for the reflected light when the rms roughness of the interface is higher than 25 nm. The rms roughness of the back interface of the four cells is found to be dependent on the intrinsic layer thickness and is larger than 25 nm.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Schade, H. and Smith, Z.E., J. Appl. Phys. 57 (2), p. 568 (1985).Google Scholar
2. Morris, J., Arya, R.R., O'Dowd, J.G., and Wiedeman, S., J. Appl. Phys. 67 (2), p. 1079 (1990).CrossRefGoogle Scholar
3. Leblanc, F., Perrin, J., and Schmitt, J., J. Appl. Phys. 75 (2), p. 1074 (1994).CrossRefGoogle Scholar
4. Zeman, M., Willemen, J.A., Vosteen, L.L.A., Tao, G., and Metselaar, J.W.. Solar Energy Materials and Solar Cells 46, p. 81 (1997).Google Scholar
5. Tao, G., Zeman, M., and Metselaar, J.W.. in Amorphous Silicon Technology-1994, ed. by Hack, M. et al., (Mater. Res. Soc. Proc. 336, San Francisco, CA 1994), p. 705710.Google Scholar
6. Stiebig, H., Kreisel, A., Winz, K., Schultz, N., Beneking, C., Eickhoff, Th. and Wagner, H., Proceedings of WCPC-1, Hawaii, (1994), p. 603606.Google Scholar
7. Tao, G., Zeman, M., and Metselaar, J.W.. Solar Energy Materials and Solar Cells 34, p. 359 (1994).CrossRefGoogle Scholar
8. Schropp, Ruud and Zeman, Miro, Amorphous and Microcrystalline Solar Cells: Modeling, Materials, and Device Technology, 1st ed. (Kluwer Academic Publishers, 1998).Google Scholar
9. Bennett, H.E. and Porteus, J.O.. J. Opt. Soc. Am. 51 (2), p. 1234 (1961).Google Scholar

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Effect of Interface Roughness on Light Scattering and Optical Properties of a-Si:H Solar Cells
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Effect of Interface Roughness on Light Scattering and Optical Properties of a-Si:H Solar Cells
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Effect of Interface Roughness on Light Scattering and Optical Properties of a-Si:H Solar Cells
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *