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Dependence of the strength of van der Waals interactions on the details of the dielectric response variation

Published online by Cambridge University Press:  12 May 2014

Jaime C. Hopkins
Affiliation:
Department of Physics, University of Massachusetts, Amherst, MA 01003, U.S.A.
Daniel M. Dryden
Affiliation:
Department of Materials Science and Engineering, Case School of Engineering, Case Western Reserve University, Cleveland Ohio, 44106-7204, U.S.A.
Wai-Yim Ching
Affiliation:
Department of Physics and Astronomy, University of Missouri-Kansas City, Kansas City, Missouri 64110, U.S.A.
Roger H. French
Affiliation:
Department of Materials Science and Engineering, Case School of Engineering, Case Western Reserve University, Cleveland Ohio, 44106-7204, U.S.A.
V. Adrian Parsegian
Affiliation:
Department of Physics, University of Massachusetts, Amherst, MA 01003, U.S.A.
Rudolf Podgornik
Affiliation:
Department of Physics, University of Massachusetts, Amherst, MA 01003, U.S.A. Department of Theoretical Physics, Jožef Stefan Institute, SI-1000 Ljubljana, Slovenia Department of Physics, Faculty of Mathematics and Physics, University of Ljubljana, SI-1000 Ljubljana, Slovenia
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Abstract

We will present a simplified approximate model showing how even small changes in the dielectric response result in substantial variations in the Hamaker coefficient of the van der Waals interactions. Since all the terms in the Matsubara summation depends on the variation of the dielectric response spectra at one particular frequency, the total change in the Hamaker coefficient depends on the spectral changes not only at that frequency but also at the rest of the spectrum properly weighted. The Matsubara terms most affected by the addition of a single peak are not those close to the position of the added peak, but are distributed over the entire range of frequencies. We comment on the possibility of eliminating van der Waals interactions and/or drastically reducing them by spectral variation in a narrow regime of frequencies.

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Copyright
Copyright © Materials Research Society 2014 

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Hopkins, Jaime C., Dryden, Daniel M., Ching, Wai - Yim, French, Roger H., Parsegian, V. Adrian, Podgornik, Rudolf, submitted (2013).

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