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Critical Review of 1-Particle Models in Electromigration Resistance Change Modeling
Published online by Cambridge University Press: 22 February 2011
Abstract
An investigation is made into the capability of one-particle models in modeling electromigration-induced resistance changes. Analytically obtained solutions to the model equations are used to gain more insight into the vacancy distribution as a result of the applied boundary conditions. These solutions are then used to determine the resistance change modeling capabilities of three types of one-particle models.
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- Copyright © Materials Research Society 1994
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