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Connection between Structure and Electronic Properties in Epitaxial Magnetic Layers

Published online by Cambridge University Press:  10 February 2011

K. N. Altmann
Affiliation:
University of Wisconsin Madison, Madison WI 53706-1390
J. A. Con Foo
Affiliation:
University of Wisconsin Madison, Madison WI 53706-1390
F. J. Himpsel
Affiliation:
University of Wisconsin Madison, Madison WI 53706-1390
J. F. Kelly
Affiliation:
University of Wisconsin Madison, Madison WI 53706-1390
M. G. Lagally
Affiliation:
University of Wisconsin Madison, Madison WI 53706-1390
J. F. MacKay
Affiliation:
University of Wisconsin Madison, Madison WI 53706-1390
W. L. O'Brien
Affiliation:
University of Wisconsin Madison, Madison WI 53706-1390
J. E. Ortega
Affiliation:
Universidad del Pals Vasco, San Sebastian, Spain
D. Y. Petrovykh
Affiliation:
Universidad del Pals Vasco, San Sebastian, Spain
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Abstract

This study explores the consequences of structure on the electronic properties of magnetic multilayers. Epitaxial layers of Co and Cu are grown on Cu(100) in a new deposition system that couples sputter-deposition with MBE and contains a wide range of characterization tools, including RHEED, LEED, and Kerr effect. This system can be coupled in situ to spin-polarized, angle-resolved photoemission and to resonant, magnetic X-ray scattering, both employing synchrotron radiation. The interface structure turns out to be critical in determining the coercivity and the presence of quantum well states, which determine oscillatory magnetic coupling.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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References

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