Skip to main content Accessibility help
×
Home
Hostname: page-component-544b6db54f-4nk8m Total loading time: 0.232 Render date: 2021-10-23T11:40:24.401Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true, "newUsageEvents": true }

Characterization of the Degradation Processes in the Buried Heterostructure Quantum Well Laser Diodes Using Internal Second Harmonic Emission

Published online by Cambridge University Press:  21 February 2011

A. T. Lupu
Affiliation:
Technical University of Moldova, 168 Stefan eel Mare str., Chisinau, 277012, Moldova.
A. V. Syrbu
Affiliation:
Technical University of Moldova, 168 Stefan eel Mare str., Chisinau, 277012, Moldova.
A. Z. Mereutza
Affiliation:
Technical University of Moldova, 168 Stefan eel Mare str., Chisinau, 277012, Moldova.
V. P. Yakovlev
Affiliation:
Technical University of Moldova, 168 Stefan eel Mare str., Chisinau, 277012, Moldova.
I. V. Kravetsky
Affiliation:
Institute of Applied Physics, Moldova Academy of Sciences, Academic Street 5, Chisinau, 277028, Moldova.
L. L. Kulyuk
Affiliation:
Institute of Applied Physics, Moldova Academy of Sciences, Academic Street 5, Chisinau, 277028, Moldova.
Get access

Abstract

Characterization of the degradation processes of single mode buried heterostructure quantum well laser diodes using traditional electrooptical parameters as well as the parameters of internal second harmonic radiation (SHR) were performed. In order to observe the stages of degradation process, especially in the vicinity of catastrophic optical damage of the laser mirror, single current pulses were superimposed on DC driving current. It was shown that the intensity of SHR is indicative of the laser diode mirror working regime: the bigger SHR intensity corresponds to the bigger optical power density on the mirror and the higher risk of mirror catastrophic optical damage.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Moser, A., Latta, E.E. and Webb, D.J., Appl. Phys. Lett. 55, 1152 (1989).CrossRefGoogle Scholar
2. Fukuda, Mitsuo, Okayasu, Masanobu, Temmyo, Jiro, and Nakano, Jun-ichi, IEEE J. Quantum Electron. QE-30, 471 (1994).CrossRefGoogle Scholar
3. Bertolotti, M., Liakhou, G., Voti, R. Li., Wang, Ruo Peng, Sibilla, C., Yakovlev, V.P.. J. Appl. Phys. 74, 7054 (1993).CrossRefGoogle Scholar
4. Katsavetz, N.I., Kudrik, I.E., Pitkianen, P.V., presented at the 1994 SPIE Technical Conference 2148A-20”, Los Angeles, 1994 (unpublished).Google Scholar
5. Brugger, H., Epperlein, P.W., Appl.Phys. Lett. 56, 1049 (1990).CrossRefGoogle Scholar
6. Kravetsky, I.V., Kulyuk, L.L., Lupu, A.T., Shutov, D.A., Suruceanu, G.I., Syrbu, A.V., Yakovlev, V.P., Applied Surface Science, 69, 424 (1993).CrossRefGoogle Scholar
7. Yakovlev, V.P., Lupu, A.T., Syrbu, A.V., Suruceanu, G.I., Kravetsky, I.V., Kulyuk, L.L., Naresh Chand. presented at the 1994 SPIE Technical Conference 2148C-48', Los Angeles, 1994 (unpublished).Google Scholar
8. Yakovlev, V.P., Lupu, A.T., Syrbu, A.V., Suruceanu, G.I., Kravetsky, I.V., Kulyuk, L.L., Naresh Chand, presented at the 1994 2nd International Workshop on expert evaluation and control of compound semiconductor materials and technologies, Parma, Italy 1994 (unpublished).Google Scholar
9. Chand, Naresh, Chu, S.N.G., Dutta, N.K., Lopata, John, Geva, Michael, Syrbu, A.V. and Yakovlev, V.P., IEEE J. Quantum Electron. QE-30, 424 (1994).CrossRefGoogle Scholar

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Characterization of the Degradation Processes in the Buried Heterostructure Quantum Well Laser Diodes Using Internal Second Harmonic Emission
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Characterization of the Degradation Processes in the Buried Heterostructure Quantum Well Laser Diodes Using Internal Second Harmonic Emission
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Characterization of the Degradation Processes in the Buried Heterostructure Quantum Well Laser Diodes Using Internal Second Harmonic Emission
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *