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Characterization of New Materials in A Four-Sample Thermoelectric Measurement System

Published online by Cambridge University Press:  01 February 2011

Nishant A. Ghelani
Affiliation:
Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI.
Sim Y. Loo
Affiliation:
Department of Electrical and Computer Engineering, Michigan State University, East Lansing, MI.
Duck-Young Chung
Affiliation:
Chemistry Department, Michigan State University, East Lansing, MI.
Sandrine Sportouch
Affiliation:
Chemistry Department, Michigan State University, East Lansing, MI.
Stephan de Nardi
Affiliation:
Chemistry Department, Michigan State University, East Lansing, MI.
Mercouri G. Kanatzidis
Affiliation:
Chemistry Department, Michigan State University, East Lansing, MI.
Timothy P. Hogan
Affiliation:
Chemistry Department, Michigan State University, East Lansing, MI.
George S. Nolas
Affiliation:
R & D Division, Marlo w Industries, Inc., Dallas, TX.
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Abstract

Several new materials in the CsBi4Te6, A2Bi8Se13, (A = K, Rb, Cs), HoNiSb, Ba/Ge/B (B = In, Sn), and AgPbBiQ3 (Q = S, Se, Te) systems have shown promising characteristics for thermoelectric applications. New synthesis techniques are able to produce samples at much higher rates than previously possible. This has led to a persistent challenge in thermoelectric materials research of rapid and comprehensive characterization of samples. This paper presents a description of a new 4-sample transport measurement system and the related measurement techniques. Special features of the system include fully computer-controlled operation (implemented in LabView™) for simultaneous measurement of electrical conductivity, thermo-electric power, and thermal conductivity. This system has been successfully used to characterize several new thermoelectric materials (including some of the above-mentioned compounds) and reference materials exhibiting a wide range of thermal conductivities.

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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References

1. Kanatzidis, M., DiSalvo, F. J., “Thermoelectric Materials: Solid State Synthesis,” Naval Research Reviews, Vol. 48, No. 4 (1996).Google Scholar
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3. Hogan, T., Ghelani, N., Loo, S., Sportouch, S., Kim, S.-J., Duck-Young, C, Kanatzidis, M., “Measurement System for Doping and Alloying Trends In New Thermoelectric Materials,” Materials Research Society Symposium Proceedings, Vol. 545 (1999).Google Scholar
4. Maldonado, O., “Pulsed Method for Simultaneous Measurement of Electric Thermopower and Heat Conductivity at Low Temperatures,” Cryogenics, Vol. 32, No. 10 (1992), pp. 908912.CrossRefGoogle Scholar
5. Cahill, D.G., “Thermal-Conductivity Measurement from 30-K to 750-K - The 3-Omega Method,” Review of Scientific Instruments, Vol. 61 (1990).CrossRefGoogle Scholar
6. Duck-Young, C, Hogan, T., Ghelani, N., Brazis, P., Lane, M., Kannewurf, C., Kanatzidis, M., “Investigations of Solid Solutions of CsBi4Te6,” Materials Research Society Symposium Proceedings, Spring 2000.Google Scholar

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Characterization of New Materials in A Four-Sample Thermoelectric Measurement System
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