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Calculations of Perovskite Surface Relaxation

Published online by Cambridge University Press:  21 March 2011

E. Heifets
Affiliation:
Carnegie Institution of Washington, Washington, D.C.20015 Seismological Laboratory, California Institute of Technology, Pasadena, CA 91125
E.A. Kotominc
Affiliation:
Fachbereich Physik, Universität Osnabräck, D-49069 Osnabrück, Germany Institute of Solid State Physics, University of Latvia, 8 Kengaraga, Riga LV-1063, Latvia
R.I. Eglitisc
Affiliation:
Fachbereich Physik, Universität Osnabräck, D-49069 Osnabrück, Germany
R.E. Cohen
Affiliation:
Carnegie Institution of Washington, Washington, D.C.20015 Seismological Laboratory, California Institute of Technology, Pasadena, CA 91125
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Abstract

The (100) and (110) surface relaxations are calculated for SrTiO3 and BaTiO3 perovskite thin films by means of a semi-empirical shell model (SM) for different surface terminations. Our SM results for the (100) surface structure are in good agreement with our present ab initio Hartree-Fock calculations with electron correlation corrections, previous ab initio pseudopotential calculationsand LEED experiments. The surface energy for the Ba-, Sr-, TiO- terminated (110) surfaces is found much larger than that for the (100) one. In contrast, the surface energy for the asymmetric O-termination, where outermost O atoms are strongly on-plane displaced, is the lowest for all (110) terminations and thus the most stable.

Type
Research Article
Copyright
Copyright © Materials Research Society 2001

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References

[1] Noguera, C., Physics and Chemistry at Oxide Surfaces, Cambridge Univ. Press, N.Y., 1996.Google Scholar
[2] Lines, M.E. and Glass, A.M., Principles and Applications of Ferroelectrics and Related Materials, Clarendon, Oxford, 1977.Google Scholar
[3] Auciello, O., Scott, J.F., and Ramesh, R., Physics Today, July 1998, 22.Google Scholar
[4] Proceedings of the Williamsburg workshop on Ferroelectrics-99, J. Phys. Chem. Sol., 61, No 2 (2000).Google Scholar
[5] Zhong, W., Vanderbilt, D., Phys. Rev. B 53, 5047 (1996).Google Scholar
[6] Bickel, N., Schmidt, G., Heinz, K., and Müller, K., Phys. Rev. Lett. 62, 2009 (1989).Google Scholar
[7] Hikita, T., Hanada, T., Kudo, M., Kawai, M., Surf. Sci. 287/288, 377 (1993).Google Scholar
[8] Kudo, M., Hikita, T., Hanada, T., Sekine, R., and Kawai, M.,Surf. and Interf. Analysis, 22, 412 (1994).Google Scholar
[9] Ikeda, A., Nishimura, T., Morishita, T., Kido, Y., Surf. Sci. 433–435, 520 (1999).Google Scholar
[10] Nishimura, T., Ikeda, A., Namba, H., Morishita, T., Kido, Y., Surf. Sci. 421, 273 (1999).Google Scholar
[11] Padilla, J. and Vanderbilt, D., Surf. Sci. 418, 64 (1998).Google Scholar
[12] Padilla, J. and Vanderbilt, D., Phys. Rev. B 56, 1625 (1997).Google Scholar
[13] Meyer, B., Padilla, J., and VVanderbilt, D., Faraday Discussions, 114, 395 (1999).Google Scholar
[14] Cora, F. and Catlow, C.R.A., Faraday Discussions, 114, 421 (1999).Google Scholar
[15] Cohen, R.E., Ferroelectrics 194, 323342 (1997).Google Scholar
[16] Fu, L., Yashenko, E., Resca, L., and Resta, R., Phys. Rev. B 60, 26972703 (1999).Google Scholar
[17rsqb; Cheng, C., Kunc, K., and Lee, M.H., Phys. Rev. B, 62, 1040910417 (2000).Google Scholar
[18] Ravikumar, V., Wolf, D., and Dravid, V.P., Phys. Rev. Lett., 74, 960 (1995).Google Scholar
[19] Prade, J., Schröder, U., Kress, W., Kulkarni, F.W. de, J. Phys: Condens. Matter, 5, 1 (1993).Google Scholar
[20] , Tinte and , Tachiotti, AIP Conf. Proc 535 ed. Cohen, R, 273282 (2000).Google Scholar
[21] Bando, H., Aiura, Y., Haruyama, Y., Shimizu, T., Nishihara, Y., J. Vac. Sci. Technol., B 13, 1150 (1995); K.Szot and W.Speier, Phys. Rev. B 60, 5909 (1999); Q.D.Jiang and J.Zegenhagen, Surf. Sci. 425, 343 (1999); R.Souda, Phys. Rev. B 60, 6068 (1999).Google Scholar
[22] Heifets, E., Kotomin, E.A., and Maier, J., Surf. Sci., 462, 19 (2000).Google Scholar
[23] Gay, D.H. and Rohl, A.L., J. Chem. Soc. Faraday Trans. 91, 925 (1995).Google Scholar
[24] Dovesi, R., Saunders, V.R., Roetti, C., Causa, M., Harrison, N.M., Orlando, R., Apra, E., Crystal-95 User Manual (University of Torino, 1996).Google Scholar
[25] Tasker, P.W., J. Phys. C : Solid State Phys., 12, 4977 (1979).Google Scholar