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Analysis of the Sublimation Growth Process of Silicon Carbide Bulk Crystals

Published online by Cambridge University Press:  15 February 2011

R. Eckstein
Affiliation:
Materials Science Department 6, University of Erlangen-Nürnberg, Martensstr. 7
D. Hofmann
Affiliation:
Materials Science Department 6, University of Erlangen-Nürnberg, Martensstr. 7
Y. Makarov
Affiliation:
Fluid Mechanics Institute, University of Erlangen-Nürnberg, Cauerstr. 4
St. G. Müller
Affiliation:
Materials Science Department 6, University of Erlangen-Nürnberg, Martensstr. 7
G. Pensl
Affiliation:
Applied Physics Institute, University Erlangen-Nürnberg, Staudtstr. 7, D-91058 Erlangen, Germany
E. Schmitt
Affiliation:
Materials Science Department 6, University of Erlangen-Nürnberg, Martensstr. 7
A. Winnacker
Affiliation:
Materials Science Department 6, University of Erlangen-Nürnberg, Martensstr. 7
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Abstract

Experimental and numerical analysis have been performed on the sublimation growth process of SiC bulk crystals. Crystallographic, electrical and optical properties of the grown silicon carbide (SIC) crystals have been evaluated by various characterization techniques. Numerical models for the global simulation of SiC bulk growth including heat and mass transfer and chemical processes are applied and experimentally verified.

Type
Research Article
Copyright
Copyright © Materials Research Society 1996

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References

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