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30 Years of Electromigration Research: A Grand Masters' Perspective
Published online by Cambridge University Press: 15 February 2011
Extract
At the MRS Spring Meeting in San Francisco this year, a special historical session was held in the symposium on Materials Reliability in Microelectronics to reflect upon thirty years of research into electromigration as a failure mode in integrated circuits. Six of the original “discoverers” of electromigration as a reliability issue were invited to speak of their work and to relate stories of the early days of these historic efforts.
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- Copyright © Materials Research Society 1996
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