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Digital analysis of X-ray films

Published online by Cambridge University Press:  05 July 2018

David C. Palmer
David C. Palmer*
Affiliation:
Department of Earth Sciences, The Open University, Walton Hall, Milton Keynes, MK7 6AA, UK
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Abstract

High-resolution intensity profiles can be generated from X-ray diffraction films using a desk-top scanner and computer image analysis. The resulting intensity profiles have spatial resolutions equal to, or exceeding that of modern powder diffractometers — at a fraction of the cost. This technique provides an economical way of preserving the information stored in libraries of old (and deteriorating) powder diffraction films. The same technique can also be extended to permit quantitative analysis of single-crystal diffraction films.

Keywords

X-ray diffractionpowder techniqueX-ray filmsdigital analysiscomputers in crystallography
Type
Technique
Information
Mineralogical Magazine , Volume 61 , Issue 406 , June 1997 , pp. 453 - 461
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1997

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References

O'Neill, B., Ngugen, J.H. and Jeanloz, R. (1993) Rapid computer analysis of X-ray diffraction films. Amer. Mineral., 78, 1332-5.Google Scholar
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