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The development of X-ray photo-emission electron microscopy (XPEEM) for valence-state imaging of mineral intergrowths

Published online by Cambridge University Press:  05 July 2018

A. D. Smith ,
P. F. Schofield ,
G. Cressey ,
B. A. Cressey  and
P. D. Read
A. D. Smith*
Affiliation:
CLRC Daresbury Laboratory, Daresbury, Warrington WA4 4AD, UK
P. F. Schofield*
Affiliation:
Department of Mineralogy, Natural History Museum, Cromwell Road, London SW7 5BD, UK
G. Cressey
Affiliation:
Department of Mineralogy, Natural History Museum, Cromwell Road, London SW7 5BD, UK
B. A. Cressey
Affiliation:
Science & Engineering Electron Microscopy Centre, Department of Chemistry, University of Southampton, Highfield, Southampton SO17 1BJ, UK
P. D. Read
Affiliation:
CLRC Rutherford Appleton Laboratory, Chilton, Didcot, Oxfordshire OX11 0QX, UK
*
*E-mail: adsmith@dl.ac.uk
†E-mail: p.schofield@nhm.ac.uk
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Abstract

We demonstrate the potential of X-ray photo-emission electron microscopy (XPEEM) to reveal valence-state images of the spatial distribution and relative concentration of metals in specific oxidation states. Additionally, XPEEM allows X-ray absorption spectra to be extracted from chosen pixel areas of the images. Using an in-house-built XPEEM instrument we show an application of the method in providing valence-state images of complex mineral intergrowths. The image resolution achieved with this instrument of simple design was ∼5 μm and reasonable quality X-ray absorption spectra were extracted from areas of ∼5×5 μm. These initial results suggest that by using commercial XPEEM instruments on 3rd generation, high-brightness synchrotron sources a spatial resolution of 100 nm or better could be achieved, with the ability to extract high-quality X-ray absorption spectra from areas of 0.1 μm2. Given that standard thin sections or polished blocks can be studied by XPEEM, and that each XPEEM image records ∼1000 μm2, XPEEM can be used in conjunction with other analytical methods such as EMPA and TEM-EELS/PEELS.

Keywords

X-ray photo-emission electron microscopyXPEEMvalence-state imagingXAScrystal chemistry
Type
Research Article
Information
Mineralogical Magazine , Volume 68 , Issue 6 , December 2004 , pp. 859 - 869
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 2004

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