Force modulation Imaging is a scanning probe microscopy (SPM) technique that identifies and maps differences in surface stiffness or elasticity. It is one of several new techniques developed as extensions to the basic SPM topographical mapping capabilities. These techniques use a variety of surface properties to better differentiate among materials where topographical differences are small or immeasurable.

Force Modulation Imaging can be used in a wide range of applications including identifying transitions between different components in composites, rubber and polymer blends, evaluating polymer homogeneity, imaging organic materials on hard substrates, detecting residual photoresist on integrated circuits, and identifying contaminants in a variety of materials.