Microscopy and Microanalysis: Volume 21 - Proceedings of Microscopy & Microanalysis 2015

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Microscopy and Microanalysis
ISSN: 1431-9276

EISSN: 1435-8115

URL: /core/journals/microscopy-and-microanalysis
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Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

Reduction of Electron Scattering Image Blur for Atmospheric Scanning Electron Microscopy

In-situ ETEM Observation of Propene Epoxidation by Gold Nanoparticles Supported on Anatase TiO2

In situ observation of degradation of electrocatalysts in humidified air atmosphere using a cold FE 60-300 kV ETEM

XEDS and EELS in the TEM at Atmospheric Pressure and High Temperature

A Controllable Environmental-Cell (EC) for Wet Environmental TEM (WETEM)

Exploring the Carbon Deposition Mechanism on Ni/Gd Ceria Catalysts

In-situ TEM Study of the Initial Oxidation Behavior of Zry-4

Transmission Electron Microscopy of Crystallization of Lysozyme in a Solution

Effect of Electron Beam on Nanoparticle Dynamics in Solution during in situ TEM Observation

Role of Fluid-Mediated Interactions in Guiding Nanoparticle Assembly

The Two Dimensional Nanoplate Dynamics Revealed by in situ Liquid Cell TEM

Dynamic studies of solution-based reactions using operando TEM

Precision In Situ Control of Local Liquid Chemistry via Electron Irradiation

Probing Nanoparticle Dynamics in 200 nm Thick Liquid Layers at Millisecond Time Resolution

Bonding Pathways of Gold Nanocrystals in Solution

Electron Beam Induced Domain Motion in Ferroelectric RKTP Observed By Transmission Electron Microscopy

In Situ Analysis of the Fracture Behavior of Nanocrystalline Copper Using Precession-Assisted Crystal Orientation Mapping

P06 Failure Analysis Applications of Microanalysis, Microscopy, Metallography, and Fractography

Abstract

Observation of the Potential Distribution in GaN-Based Devices by a Scanning Electron Microscope

Denickelification and Dezincification of Copper Alloys in Water Environments

Application of EFTEM and XEDS Elemental Mapping to Characterization of Nanometer Devices in Semiconductor Wafer-Foundries

Microscopy and Microanalysis

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Proceedings of Microscopy & Microanalysis 2015

Physical Science Symposia

P01 Bringing the Real World into the Electron Microscope: Peter R. Swann Memorial Symposium on In situ TEM and STEM

Abstract

P06 Failure Analysis Applications of Microanalysis, Microscopy, Metallography, and Fractography

Abstract