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X-ray Phase Imaging by Two-Beam Interferometry with Full-Field X-ray Microscope and Transmission Grating

Published online by Cambridge University Press:  10 August 2018

Atsushi Momose
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku Univ., Sendai, Japan. JASRI/SPring-8, Sayo, Japan.
Hidekazu Takano
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku Univ., Sendai, Japan.
Yanlin Wu
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku Univ., Sendai, Japan.
Karol Vegso
Affiliation:
JASRI/SPring-8, Sayo, Japan.
Yasuko Terada
Affiliation:
JASRI/SPring-8, Sayo, Japan.
Masato Hoshino
Affiliation:
JASRI/SPring-8, Sayo, Japan.
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Abstract

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Copyright
© Microscopy Society of America 2018 

References

[1] Momose, A NIMA 352 1995 622628.CrossRefGoogle Scholar
[2] Takeda, Y, et al, Appl. Physics. Express 1 2008 117002.CrossRefGoogle Scholar
[3] Yashiro, W, et al, Phys. Rev. Lett. 103 2009 180801.CrossRefGoogle Scholar
[4] Momose, A Microscopy 66 2017 155.CrossRefGoogle Scholar
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