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Using Multivariate Analysis of Scanning-Rochigram Data to Reveal Material Functionality

Published online by Cambridge University Press:  25 July 2016

Stephen Jesse
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN37831 Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN37831
Miaofang Chi
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN37831 Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN37831
Albina Y. Borisevich
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN37831 Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN37831
Alex Belianinov
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN37831 Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN37831
Sergei V. Kalinin
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN37831 Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN37831
Eirik Endeve
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN37831 Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN37831
Richard K. Archibald
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN37831 Computer Science and Mathematics Division, Oak Ridge National Laboratory, Oak Ridge, TN37831
Christopher T. Symons
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN37831 Computational Sciences & Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN37831
Andrew R. Lupini
Affiliation:
Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN37831 Materials Science & Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN37831

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

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[5] The authors would like to acknowledge Liang Jin and Benjamin Bammes for their assistance in allowing us to use the DE-12 system. http://www.directelectron.com/.Google Scholar
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[8] Research supported by: Oak Ridge National Laboratory Center for Nanophase Materials Sciences (CNMS), which is sponsored by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy [MC], by the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the U. S. Department of Energy [SJ,AB], and by Division of Materials Sciences and Engineering Division, Office of Basic Energy Sciences, U.S. DOE [AYB,ARL]. This study used the resources of the Oak Ridge Leadership Computing Facility at the Oak Ridge National Laboratory, and analysis under support of applied mathematics program at the DOE. [EE,RKA,CTS].Google Scholar