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Unraveling the Relationship Between Layer Stacking and Magnetic Order in Nb3X8 Systems via Controlled-Temperature Cryo-STEM

Published online by Cambridge University Press:  05 August 2019

Elisabeth Bianco
Affiliation:
Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA.
Ismail El Baggari
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA.
Berit H. Goodge
Affiliation:
Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA. School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.
Chris Pasco
Affiliation:
Department of Chemistry, The Johns Hopkins University, Baltimore, MD, USA.
Tyrel M. McQueen
Affiliation:
Department of Chemistry, The Johns Hopkins University, Baltimore, MD, USA.
Lena F. Kourkoutis*
Affiliation:
Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, USA. School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.
*
*Corresponding author: lena.f.kourkoutis@cornell.edu

Abstract

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Type
In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Hovden, R., et al. , Proc. Natl. Acad. Sci. U.S.A. 113 (2016), p. 11420.Google Scholar
[2]El Baggari, I., et al. , Proc. Natl. Acad. Sci. U.S.A. 115 (2018), p. 1445.Google Scholar
[3]Savitzsky, B.H., et al. , Ultramic. 191 (2018), p. 56.Google Scholar
[4]Kennedy, J., et al. , Mater. Sci. Forum 91 -93 (1992), p. 183.Google Scholar
[5]Sheckelton, J.P., et al. , Inorg. Chem. Front. 4 (2017), p. 481.Google Scholar
[6]Hotz, , et al. Microsc. Microanal. 24 (2018), p. 1132-1133.Google Scholar
[7]This work is supported by PARADIM, an NSF-MIP (DMR-1539918), and NSF DMR-1429155 & DMR-1719875.Google Scholar