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Unit-cell Scale Measurements of Oxygen Vacancy Concentration and Homogeneity in SOFC Cobaltite Thin Films

Published online by Cambridge University Press:  23 November 2012

Y. Kim ,
J. He ,
M.D. Biegalski ,
H.A. Ambaye ,
V. Lauter ,
H.M. Christen ,
S.J. Pennycook ,
S.V. Kalinin  and
S.T. Pantelides
Y. Kim
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
J. He
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
M.D. Biegalski
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
H.A. Ambaye
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
V. Lauter
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
H.M. Christen
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
S.J. Pennycook
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
S.V. Kalinin
Affiliation:
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN
S.T. Pantelides
Affiliation:
Vanderbilt University, Nashville, TN
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1310 - 1311
Copyright
Copyright © Microscopy Society of America 2012

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