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Ultrafast Laser-Pump Electron-Probe Microscopy for Imaging Semiconductor Carrier Dynamics

Published online by Cambridge University Press:  05 August 2019

Mathijs W.H. Garming ,
I.G. (Gerward) C. Weppelman ,
Pieter Kruit  and
Jacob P. Hoogenboom
Mathijs W.H. Garming
Affiliation:
Imaging Physics, Delft University of Technology, Delft, The Netherlands
I.G. (Gerward) C. Weppelman
Affiliation:
Imaging Physics, Delft University of Technology, Delft, The Netherlands
Pieter Kruit
Affiliation:
Imaging Physics, Delft University of Technology, Delft, The Netherlands
Jacob P. Hoogenboom*
Affiliation:
Imaging Physics, Delft University of Technology, Delft, The Netherlands
*
*Corresponding author: j.p.hoogenboom@tudelft.nl

Abstract

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Type
Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2000 - 2001
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Cho, et al. , PNAS 111 (2014), p. 2094.Google Scholar
[2]Liao, et al. , Nano Lett. 17 (2017), p. 3675.Google Scholar
[3]Moerland, et al. , Nano Lett. 18 (2018), p. 6107.Google Scholar
[4]Garming, et al. , Nanoscale 9 (2017), p. 12727.Google Scholar
[5]Moerland, et al. , Optics Express 24 (2016), p. 24760.Google Scholar