Ultrafast Electron Diffraction and Microscopy: Why We Should Know About Transient Electric Fields and Where They Come From

H Park; J-M Zuo

doi:10.1017/S1431927610057272

Ultrafast Electron Diffraction and Microscopy: Why We Should Know About Transient Electric Fields and Where They Come From

Published online by Cambridge University Press: 01 August 2010

H Park and

J-M Zuo

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H Park: Affiliation:
University of Illinois, Urbana Champaign
J-M Zuo: Affiliation:
University of Illinois, Urbana Champaign

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type: Abstract
Information: Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 496 - 497

DOI: https://doi.org/10.1017/S1431927610057272 [Opens in a new window]

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Ultrafast Electron Diffraction and Microscopy: Why We Should Know About Transient Electric Fields and Where They Come From

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