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Transmission Electron Microscopy at Atmospheric Pressure

Published online by Cambridge University Press:  25 July 2016

Xiaoqing Pan
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, California, USA Department of Physics and Astronomy, University of California-Irvine, Irvine, California, USA
Shuyi Zhang
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, California, USA Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan, USA
Sheng Dai
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, California, USA Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan, USA
George W. Graham
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Allard, L.F., et al., Microsc. Microanal 18 (2012) 656.CrossRefGoogle Scholar
[2] Cargnello, M., et al., Science 337 (2012) 713.CrossRefGoogle Scholar
[3] The authors gratefully acknowledge funding from the National Science Foundation under grants DMR-0723032 and CBET-115940.Google Scholar