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Transforming Transmission Electron Microscopy with MerlinEM Electron Counting Detector

Published online by Cambridge University Press:  30 July 2020

Matus Krajnak
Affiliation:
Quanum Detectors Ltd., Harwell Oxford, England, United Kingdom
Jean-Denis Blazit
Affiliation:
Université Paris-Saclay, CNRS, Orsay, Ile-de-France, France
Alexander Zintler
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Robert Eilhardt
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Jon Weiss
Affiliation:
NanoMEGAS USA, Tempe, Arizona, United States
Doug Cosart
Affiliation:
NanoMEGAS USA, Tempe, Arizona, United States
Leopoldo Molina-Luna
Affiliation:
Technical University of Darmstadt, Darmstadt, Hessen, Germany
Marcel Tencé
Affiliation:
Université Paris-Saclay, CNRS, Orsay, Ile-de-France, France
Alexandre Gloter
Affiliation:
Université Paris-Saclay, CNRS, Orsay, Ile-de-France, France
Christopher Allen
Affiliation:
Electron Physical Science Imaging Centre, Diamond Light Source, Didcot, England, United Kingdom
Damien McGrouther
Affiliation:
University of Glasgow, UK, Glasgow, Scotland, United Kingdom
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Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Copyright
Copyright © Microscopy Society of America 2020

References

Raighne, Mac, et al, A.. “Medipix2 as a highly flexible scanning/imaging detector for transmission electron microscopy.Journal of Instrumentation 6.01 (2011): C01047.10.1088/1748-0221/6/01/C01047CrossRefGoogle Scholar
Krajnak, Matus, et al. . “Pixelated detectors and improved efficiency for magnetic imaging in STEM differential phase contrast.Ultramicroscopy 165 (2016): 42-50.10.1016/j.ultramic.2016.03.006CrossRefGoogle ScholarPubMed
O'Leary, Colum M., et al. . “Electron Ptychography Using Fast Binary 4D STEM Data.Microscopy and Microanalysis 25.S2 (2019): 1662-1663.10.1017/S1431927619009048CrossRefGoogle Scholar
Gibert, Marta, et al. . “Interfacial control of magnetic properties at LaMnO3/LaNiO3 interfaces.Nano letters 15.11 (2015): 7355-7361.10.1021/acs.nanolett.5b02720CrossRefGoogle ScholarPubMed
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Transforming Transmission Electron Microscopy with MerlinEM Electron Counting Detector
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