Trace and Small Phase Analysis : a New Generation of Column for Electron Microprobe

C. Fournier

doi:10.1017/S1431927603442633

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Trace and Small Phase Analysis : a New Generation of Column for Electron Microprobe

Published online by Cambridge University Press: 21 July 2003

C. Fournier

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C. Fournier*: Affiliation:
CAMECA, 103 Bd. St-Denis, 92403, Courbevoie cedex, France

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 526 - 527

DOI: https://doi.org/10.1017/S1431927603442633 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2003

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Trace and Small Phase Analysis : a New Generation of Column for Electron Microprobe

Volume 9, Issue S02
C. Fournier ^(a1)
DOI: https://doi.org/10.1017/S1431927603442633

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Trace and Small Phase Analysis : a New Generation of Column for Electron Microprobe

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