Skip to main content Accessibility help
×
Home
Hostname: page-component-564cf476b6-2fphr Total loading time: 0.207 Render date: 2021-06-20T08:14:08.941Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true }

Towards an End-to-end Radiation Defect Quantitative Characterization Workflow Using Advanced Microscopy Images

Published online by Cambridge University Press:  30 July 2020

Rajat Sainju
Affiliation:
University of Connecticut, Storrs, Connecticut, United States
Graham Roberts
Affiliation:
Lawrence Berkeley National Lab, Berkeley, California, United States
Colin Ophus
Affiliation:
Western Washington University, Bellingham, Washington, United States
Brian Hutchinson
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Jing Wang
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Mychailo B. Toloczko
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Richard J Kurtz
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Charles H Henager Jr
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Danny J. Edwards
Affiliation:
Pacific Northwest National Laboratory, Richland, Washington, United States
Yuanyuan Zhu
Affiliation:
University of Connecticut, Storrs, Connecticut, United States Pacific Northwest National Laboratory, Richland, Washington, United States
Corresponding
E-mail address:
Rights & Permissions[Opens in a new window]

Abstract

Image of the first page of this article. For PDF version, please use the ‘Save PDF’ preceeding this image.
Type
Advanced Characterization of Nuclear Fuels and Materials
Copyright
Copyright © Microscopy Society of America 2020

References

Zhu, Y, Ophus, C, Toloczko, MB and Edwards, DJ, Ultramicroscopy, 193(2018) 1223.10.1016/j.ultramic.2018.06.001CrossRefGoogle Scholar
Roberts, G, Haile, S Y, Sainju, R, Edwards, D J, Hutchinson, B and Zhu, Y, Scientific Reports 9(2019), 1274410.1038/s41598-019-49105-0CrossRefGoogle Scholar
Sainju, R, Ophus, C, Toloczko, MB and Edwards, DJ and Zhu, Y. in preparationGoogle Scholar
Authors thank Mr. Deep Patel for supporting image labeling. We acknowledge funding from the U.S. DOE Office of Fusion Energy Sciences under contract DE-AC05-76RL01830, Office of Nuclear Energy's Nuclear Energy Enabling Technologies program project CFA 16-10570, UConn HPC computing facility and PNNL Research Computing program for the GPUs used in this research.Google Scholar
You have Access

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Towards an End-to-end Radiation Defect Quantitative Characterization Workflow Using Advanced Microscopy Images
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Towards an End-to-end Radiation Defect Quantitative Characterization Workflow Using Advanced Microscopy Images
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Towards an End-to-end Radiation Defect Quantitative Characterization Workflow Using Advanced Microscopy Images
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *